Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite

Hiroki Asakawa; Masashi Natsui; Yoshimichi Ohki; Toshikatsu Tanaka; Takashi Maeno; Kenji Okamoto

doi:10.1109/ICSD.2010.5568010

Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite

Hiroki Asakawa^*, Masashi Natsui, Yoshimichi Ohki, Toshikatsu Tanaka, Takashi Maeno, Kenji Okamoto

^*Corresponding author for this work

School of Advanced Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.

Original language	English
Title of host publication	Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
DOIs	https://doi.org/10.1109/ICSD.2010.5568010
Publication status	Published - 2010 Oct 25
Event	2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 - Potsdam, Germany Duration: 2010 Jul 4 → 2010 Jul 9

Publication series

Name	Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010

Other

Other	2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
Country/Territory	Germany
City	Potsdam
Period	10/7/4 → 10/7/9

Keywords

Electrochemical migration
Paper/phenol-resin composite
Printed wiring board
Pulsed electroacoustic method
SEM-EDS
Space charge

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/ICSD.2010.5568010

Cite this

Asakawa, H., Natsui, M., Ohki, Y., Tanaka, T., Maeno, T., & Okamoto, K. (2010). Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. In Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010 Article 5568010 (Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010). https://doi.org/10.1109/ICSD.2010.5568010

Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. / Asakawa, Hiroki; Natsui, Masashi; Ohki, Yoshimichi et al.
Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010. 2010. 5568010 (Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Asakawa, H, Natsui, M, Ohki, Y, Tanaka, T, Maeno, T & Okamoto, K 2010, Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. in Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010., 5568010, Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010, 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010, Potsdam, Germany, 10/7/4. https://doi.org/10.1109/ICSD.2010.5568010

Asakawa H, Natsui M, Ohki Y, Tanaka T, Maeno T, Okamoto K. Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite. In Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010. 2010. 5568010. (Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010). doi: 10.1109/ICSD.2010.5568010

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title = "Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite",

abstract = "In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.",

keywords = "Electrochemical migration, Paper/phenol-resin composite, Printed wiring board, Pulsed electroacoustic method, SEM-EDS, Space charge",

author = "Hiroki Asakawa and Masashi Natsui and Yoshimichi Ohki and Toshikatsu Tanaka and Takashi Maeno and Kenji Okamoto",

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AU - Asakawa, Hiroki

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AU - Ohki, Yoshimichi

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AU - Maeno, Takashi

AU - Okamoto, Kenji

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N2 - In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.

AB - In order to study the growth of electrochemical migration along the thickness direction, paper/phenol-resin composite on printed wiring boards was aged at 85 °C and 85%RH by applying of a dc voltage. Then, the sample was observed by a scanning electron microscope with a function of energy dispersive spectroscopy (SEM-EDS) analysis. Space charge distributions in the sample were also measured by the pulsed electroacoustic method. Signals of SEM-EDS showing the presence of Cu were observed on both the anode and cathode. This fact indicates that ionized copper moves toward the cathode inside the composite when an electric field is applied at high temperatures in a highly humid atmosphere.

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KW - Pulsed electroacoustic method

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Detection of electrochemical migration growth along the thickness direction in a paper/phenol-resin composite

Abstract

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Keywords

ASJC Scopus subject areas

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