Development of a CdTe pixel detector with a window comparator ASIC for high energy X-ray applications

T. Hirono*, H. Toyokawa, Y. Furukawa, T. Honma, H. Ikeda, M. Kawase, T. Koganezawa, T. Ohata, M. Sato, G. Sato, M. Takagaki, T. Takahashi, S. Watanabe

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)


We have developed a photon-counting-type CdTe pixel detector (SP8-01). SP8-01 was designed as a prototype of a high-energy X-ray imaging detector for experiments using synchrotron radiation. SP8-01 has a CdTe sensor of 500μm thickness, which has an absorption efficiency of almost 100% up to 50 keV and 45% even at 100 keV. A full-custom application specific integrated circuit (ASIC) was designed as a readout circuit of SP8-01, which is equipped with a window-type discriminator. The upper discriminator realizes a low-background measurement, because X-ray beams from the monochromator contain higher-order components beside the fundamental X-rays in general. ASIC chips were fabricated with a TSMC 0.25μm CMOS process, and CdTe sensors were bump-bonded to the ASIC chips by a gold-stud bonding technique. Beam tests were performed at SPring-8. SP8-01 detected X-rays up to 120 keV. The capability of SP8-01 as an imaging detector for high-energy X-ray synchrotron radiation was evaluated with its performance characteristics.

Original languageEnglish
Pages (from-to)88-91
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Issue number1
Publication statusPublished - 2011 Sept 11


  • CdTe
  • Photon counting
  • Pixel detector
  • Readout ASIC
  • X-ray imaging

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics


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