Development of an NDE method using SQUIDs for the reconstruction of defect shapes

Y. Hatsukade*, N. Kasai, H. Takashima, R. Kawai, F. Kojima, A. Ishiyama

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

5 Citations (Scopus)


The widespread use of the SQUID-NDE requires the visualization of defects. We have developed a method to obtain depth information by monitoring the SQUID output while changing the frequency of the current flowing in a sample. The effectiveness of this method was verified by experiment and simulation.

Original languageEnglish
Pages (from-to)1311-1314
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Issue number1 I
Publication statusPublished - 2001 Mar
Event2000 Applied Superconductivity Conference - Virginia Beach, VA, United States
Duration: 2000 Sept 172000 Sept 22


  • Depth profile
  • Nondestructive evaluation
  • Reconstruction of defect shape

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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