Abstract
The widespread use of the SQUID-NDE requires the visualization of defects. We have developed a method to obtain depth information by monitoring the SQUID output while changing the frequency of the current flowing in a sample. The effectiveness of this method was verified by experiment and simulation.
Original language | English |
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Pages (from-to) | 1311-1314 |
Number of pages | 4 |
Journal | IEEE Transactions on Applied Superconductivity |
Volume | 11 |
Issue number | 1 I |
DOIs | |
Publication status | Published - 2001 Mar |
Event | 2000 Applied Superconductivity Conference - Virginia Beach, VA, United States Duration: 2000 Sept 17 → 2000 Sept 22 |
Keywords
- Depth profile
- Nondestructive evaluation
- Reconstruction of defect shape
- SQUID
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering