Development of helium-microwave-induced plasma-atomic emission spectroscopy system with two-way spectroscopic analysis

Satoshi Ikezawa, Jun Yamamoto, Toshitsugu Ueda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper reports on a helium-microwave-induced plasma-atomic emission spectroscopy (He-MIP-AES) system with two-way spectroscopic analysis that fulfills the criteria prescribed by the Ministry of Environment, Japan, for measuring the chemical components of particulate matter (PM). The He-MIP-AES system is a reconstruction of a commercial particle analyzer system. In current environmental monitoring systems, PMs are typically collected on trapping filters placed across Japan and classified as either suspended particulate matter (SPM) or PM2.5 depending on the size. The collected PMs are subsequently analyzed with automated measurement instruments such as a piezo balance and with methods such as beta ray attenuation and light scattering. While these measurement methods allow the mass concentration of PMs in the air to be obtained at hourly intervals, the chemical composition of individual particles is analyzed with time-intensive laboratory procedures. In contrast, the presented measurement system allows the chemical compositions and particle sizes to be measured simultaneously in real time.

Original languageEnglish
Title of host publication2015 9th International Conference on Sensing Technology, ICST 2015
PublisherIEEE Computer Society
Pages716-721
Number of pages6
ISBN (Electronic)9781479963140
DOIs
Publication statusPublished - 2016 Mar 21
Event9th International Conference on Sensing Technology, ICST 2015 - Auckland, New Zealand
Duration: 2015 Dec 82015 Dec 11

Publication series

NameProceedings of the International Conference on Sensing Technology, ICST
Volume2016-March
ISSN (Print)2156-8065
ISSN (Electronic)2156-8073

Other

Other9th International Conference on Sensing Technology, ICST 2015
Country/TerritoryNew Zealand
CityAuckland
Period15/12/815/12/11

Keywords

  • environmental monitoring
  • micropollutant
  • microwave-induced plasma
  • nanoparticle
  • particulate matter

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Signal Processing
  • Electrical and Electronic Engineering

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