Development of silsesquioxane-type gate insulating thin films for poly(3-hexylthiophene)-based field-effect transistor

T. Hamada*, K. Tomatsu, T. Nagase, T. Kobayashi, S. Murakami, M. Watanabe, H. Naito, K. Matsukawa

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

Silsesquioxane materials were prepared by a sol-gel method, which have many advantages such as low cost, solution processability, and so on. We have investigated polymethylsilsesquioxane (PMSQ)-type gate insulating thin films with good high resistivity and surface morphology. Top-contact organic field-effect transistors (OFET) devices were fabricated using PMSQ gate insulator and poly(3-hexylthiophene) (P3HT) as the organic semiconductor.

Original languageEnglish
Pages599-600
Number of pages2
Publication statusPublished - 2007
Externally publishedYes
Event14th International Display Workshops, IDW '07 - Sapporo, Japan
Duration: 2007 Dec 52007 Dec 5

Conference

Conference14th International Display Workshops, IDW '07
Country/TerritoryJapan
CitySapporo
Period07/12/507/12/5

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging
  • Atomic and Molecular Physics, and Optics

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