Development of the multi-pixel x-ray microcalorimeters

H. Kudo*, T. Nakamura, T. Arakawa, S. Ohtsuka, T. Izumi, S. Shoji, H. Sato, H. Kobayashi, K. Mori, T. Homma, T. Osaka, K. Mitsuda, N. Y. Yamasaki, R. Fujimoto, N. Iyomoto, T. Oshima, K. Futamoto, Y. Takei, T. Ichitsubo, T. FujimoriY. Ishisaki, U. Morita, T. Koga, K. Sato, T. Ohashi, Y. Kuroda, M. Onishi, K. Otake

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

An x-ray microcalorimeter is a promising x-ray spectrometer for its extremely good energy resolution and its good detecting efficiency. We are developing an x-ray microcalorimeter for high energy resolution x-ray imaging application. The energy resolution of 43eV(FWHM) at 5.9keV is obtained with our x-ray microcalorimeter. The intrinsic performance of our x-ray microcalorimeter was estimated to be 10.4eV(FWHM) at 5.9keV. This value is more than 10 times better than that of the conventional x-ray CCD.

Original languageEnglish
Title of host publication2003 Nanotechnology Conference and Trade Show - Nanotech 2003
EditorsM. Laudon, B. Romanowicz
Pages436-439
Number of pages4
Publication statusPublished - 2003
Event2003 Nanotechnology Conference and Trade Show - Nanotech 2003 - San Francisco, CA, United States
Duration: 2003 Feb 232003 Feb 27

Publication series

Name2003 Nanotechnology Conference and Trade Show - Nanotech 2003
Volume1

Conference

Conference2003 Nanotechnology Conference and Trade Show - Nanotech 2003
Country/TerritoryUnited States
CitySan Francisco, CA
Period03/2/2303/2/27

Keywords

  • Calorimeter
  • Low temperature
  • Spectrometer
  • Temperature sensor
  • X-ray

ASJC Scopus subject areas

  • General Engineering

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