Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

Masakazu Mitsugi; Mamoru Fukunaga; Shutaro Asanuma; Yoshiaki Uesu; Wataru Kobayashi; Ichiro Terasaki

doi:10.1080/00150190701544311

Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

Masakazu Mitsugi, Mamoru Fukunaga, Shutaro Asanuma, Yoshiaki Uesu^*, Wataru Kobayashi, Ichiro Terasaki

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

In order to elucidate the origin of the characteristic dielectric response of CaCu₃Ti₄O₁₂ (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO₃ (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.

Original language	English
Pages (from-to)	191-195
Number of pages	5
Journal	Ferroelectrics
Volume	357
Issue number	1 PART 3
DOIs	https://doi.org/10.1080/00150190701544311
Publication status	Published - 2007

Keywords

CaCuTiO
Dielectric constant
Pulsed laser deposition
Thin films

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1080/00150190701544311

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@article{d1cbaccc9f8d49c7892167d4f04b32d1,

title = "Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method",

abstract = "In order to elucidate the origin of the characteristic dielectric response of CaCu3Ti4O12 (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO3 (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.",

keywords = "CaCuTiO, Dielectric constant, Pulsed laser deposition, Thin films",

author = "Masakazu Mitsugi and Mamoru Fukunaga and Shutaro Asanuma and Yoshiaki Uesu and Wataru Kobayashi and Ichiro Terasaki",

year = "2007",

doi = "10.1080/00150190701544311",

language = "English",

volume = "357",

pages = "191--195",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1 PART 3",

}

TY - JOUR

T1 - Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

AU - Mitsugi, Masakazu

AU - Fukunaga, Mamoru

AU - Asanuma, Shutaro

AU - Uesu, Yoshiaki

AU - Kobayashi, Wataru

AU - Terasaki, Ichiro

PY - 2007

Y1 - 2007

N2 - In order to elucidate the origin of the characteristic dielectric response of CaCu3Ti4O12 (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO3 (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.

AB - In order to elucidate the origin of the characteristic dielectric response of CaCu3Ti4O12 (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO3 (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.

KW - CaCuTiO

KW - Dielectric constant

KW - Pulsed laser deposition

KW - Thin films

UR - http://www.scopus.com/inward/record.url?scp=75449107553&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=75449107553&partnerID=8YFLogxK

U2 - 10.1080/00150190701544311

DO - 10.1080/00150190701544311

M3 - Article

AN - SCOPUS:75449107553

SN - 0015-0193

VL - 357

SP - 191

EP - 195

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1 PART 3

ER -

Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

Abstract

Keywords

ASJC Scopus subject areas

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