TY - JOUR
T1 - Difference in surface degradation due to partial discharges between polyamide nanocomposite and microcomposite
AU - Kozako, Masahiro
AU - Kido, Ryoichi
AU - Fuse, Norikazu
AU - Ohki, Yoshimichi
AU - Okamoto, Tatsuki
AU - Tanaka, Toshikatsu
PY - 2004/12/1
Y1 - 2004/12/1
N2 - Partial discharge (PD) degradation was investigated to compare polyamide nanocomposites with two kinds of polyamide microcomposites. Such materials were exposed to PDs under the IEC(b) electrode configuration for evaluation of PD resistance. Comparisons were made as to the surface roughness using a scanning electron microscope, an atomic force microscope, and a mechanical surface profilometer. It is concluded that polyamide nanocomposite is more resistant to PDs than microcomposites, and that nanoeffects would work against PD degradation, which include filler-matrix bonding, inter-filler space, morphology, and mesoscopic interaction.
AB - Partial discharge (PD) degradation was investigated to compare polyamide nanocomposites with two kinds of polyamide microcomposites. Such materials were exposed to PDs under the IEC(b) electrode configuration for evaluation of PD resistance. Comparisons were made as to the surface roughness using a scanning electron microscope, an atomic force microscope, and a mechanical surface profilometer. It is concluded that polyamide nanocomposite is more resistant to PDs than microcomposites, and that nanoeffects would work against PD degradation, which include filler-matrix bonding, inter-filler space, morphology, and mesoscopic interaction.
UR - http://www.scopus.com/inward/record.url?scp=17744397111&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=17744397111&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:17744397111
SN - 0084-9162
SP - 398
EP - 401
JO - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
JF - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
T2 - 2004 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Y2 - 17 October 2004 through 20 October 2004
ER -