Abstract
Features of diffuse scattering in La1.8-xSmxSr0.2CuOz have been investigated by means of electron diffraction. There exist two types of diffuse scatterings in the T- and T*-structures, which are, respectively, observed as a {100}* planar diffuse scattering and a cylindrical-shape one along c axis in reciprocal space. Because the features of the latter scattering is basically identical to those observed in NdCeSrCuO with the T*-structure, it is understood that the characteristic structural disorder due to static displacements of atoms commonly exists in superconducting oxides with the T*-structure.
Original language | English |
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Pages (from-to) | 531-532 |
Number of pages | 2 |
Journal | Physica C: Superconductivity and its applications |
Volume | 185-189 |
Issue number | PART 1 |
DOIs | |
Publication status | Published - 1991 Dec 1 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering