TY - JOUR
T1 - Direct analysis of the structure, concentration, and chemical activity of surface atomic vacancies by specialized low-energy ion-scattering spectroscopy
T2 - TiC(001)
AU - Aono, M.
AU - Hou, Y.
AU - Souda, R.
AU - Oshima, C.
AU - Otani, S.
AU - Ishizawa, Y.
PY - 1983
Y1 - 1983
N2 - The structure, concentration, and chemical activity of atomic vacancies at the TiC(001) surface have been directly analyzed by specialized low-energy ion-scattering spectroscopy. It has been found that carbon vacancies are formed at the surface under a certain condition, and they capture oxygen atoms into the vacancy holes exhibiting a very high activity.
AB - The structure, concentration, and chemical activity of atomic vacancies at the TiC(001) surface have been directly analyzed by specialized low-energy ion-scattering spectroscopy. It has been found that carbon vacancies are formed at the surface under a certain condition, and they capture oxygen atoms into the vacancy holes exhibiting a very high activity.
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U2 - 10.1103/PhysRevLett.50.1293
DO - 10.1103/PhysRevLett.50.1293
M3 - Article
AN - SCOPUS:0343075309
SN - 0031-9007
VL - 50
SP - 1293
EP - 1296
JO - Physical Review Letters
JF - Physical Review Letters
IS - 17
ER -