TY - JOUR
T1 - Direct observation of a repeatable change in electronic states with applied electric voltage pulses in the metal-insulator-metal structure
AU - Azumi, K.
AU - Aoyama, K.
AU - Asanuma, S.
AU - Uesu, Y.
AU - Katsufuji, T.
PY - 2009/3/3
Y1 - 2009/3/3
N2 - By the microspectroscopic imaging of optical reflectivity for the La1-x Srx FeO3-δ thin film with indium-tin-oxide electrodes, we observed that the shape of the conducting area between two electrodes is reversibly varied with applied electric voltage pulses and that causes a repeatable change in the electrical resistance between the electrodes. These results can be explained by the oxygen-ion migration with applied electric field, which induces a variation in the distribution of the Fe4+ ions in the thin film.
AB - By the microspectroscopic imaging of optical reflectivity for the La1-x Srx FeO3-δ thin film with indium-tin-oxide electrodes, we observed that the shape of the conducting area between two electrodes is reversibly varied with applied electric voltage pulses and that causes a repeatable change in the electrical resistance between the electrodes. These results can be explained by the oxygen-ion migration with applied electric field, which induces a variation in the distribution of the Fe4+ ions in the thin film.
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U2 - 10.1103/PhysRevB.79.121101
DO - 10.1103/PhysRevB.79.121101
M3 - Article
AN - SCOPUS:63249104169
SN - 1098-0121
VL - 79
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 12
M1 - 121101
ER -