Distance metric learning with eigenvalue fine tuning

Wenquan Wang, Ya Zhang, Jinglu Hu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Distance metric learning focuses on learning one global or multiple local distance functions to draw similar instances close to each other and push away dissimilar ones. Most existing work has to do matrix projection to learn distance functions. In this paper, we present a novel distance function learning model which is based on eigenvalue fine tuning. Our model not only is able to learn the global distance function but also can be easily adopted into local metric learning tasks. From the perspective of dimension reduction, the proposed model can measure how much information has been preserved after feature transformation. Moreover, we connect our model with principal components analysis to improve its performance by introducing the label information. Experimental results have demonstrated the effectiveness of the proposed method.

Original languageEnglish
Title of host publication2017 International Joint Conference on Neural Networks, IJCNN 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages502-509
Number of pages8
ISBN (Electronic)9781509061815
DOIs
Publication statusPublished - 2017 Jun 30
Event2017 International Joint Conference on Neural Networks, IJCNN 2017 - Anchorage, United States
Duration: 2017 May 142017 May 19

Publication series

NameProceedings of the International Joint Conference on Neural Networks
Volume2017-May

Other

Other2017 International Joint Conference on Neural Networks, IJCNN 2017
Country/TerritoryUnited States
CityAnchorage
Period17/5/1417/5/19

ASJC Scopus subject areas

  • Software
  • Artificial Intelligence

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