Effective post-BIST fault diagnosis for multiple faults

Hiroshi Takahashi*, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Engineering & Materials Science