Effects of biexciton on the polarization-sensitive cavity polariton beats in the third-order regime

T. Aoki, Y. P. Svirko, M. Kuwata-Gonokami, H. M. Gibbs

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The third-order nonlinear response of the strongly coupled cavity-exciton system shows strong signatures of the long- and short-living four-particle correlations, which manifest themselves in polarization-sensitive four-wave mixing (FWM). In particular, the long-living correlation due to the biexciton may dominate in the third-order nonlinearity of the exciton-cavity system. In presence of inhomogeneous broadening, biexciton gives rise to the oscillation in the time-integrated (TI) FWM signal at positive time delay with biexciton binding frequency, ωb, allowing one to estimate biexciton contribution to the third-order nonlinearity. However, in the strongly coupled exciton-cavity system, TI FWM measurements have been performed only in a polarization configuration that does not permit the biexcitonic contribution. We report on the observation of the biexcitonic signature in the TI FWM signal from a semiconductor microcavity with an In0.03Ga0.97As single quantum well.

Original languageEnglish
Title of host publicationTechnical Digest - Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, QELS 2001
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages1
ISBN (Electronic)155752663X, 9781557526632
DOIs
Publication statusPublished - 2001 Jan 1
Externally publishedYes
EventQuantum Electronics and Laser Science Conference, QELS 2001 - Baltimore, United States
Duration: 2001 May 62001 May 11

Publication series

NameTechnical Digest - Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, QELS 2001

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2001
Country/TerritoryUnited States
CityBaltimore
Period01/5/601/5/11

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

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