TY - GEN
T1 - Electromechanical coupling coefficient k15 of (112̄0) textured ZnO films
AU - Yanagitani, Takahiko
AU - Mishima, Natsuki
AU - Matsukawa, Mami
AU - Watanabe, Yoshiaki
PY - 2005/12/1
Y1 - 2005/12/1
N2 - The ZnO film, whose crystallites c-axis align parallel to the substrate plane [(112̄0) textured ZnO films], has many potential advantages as shear-mode piezoelectric devices. In this study, shear mode electromechanical coupling coefficient k15 of (112̄0) textured polycrystalline ZnO films was estimated. An over-moded resonator consists of metal electrode film / (112̄0) textured ZnO piezoelectric film / metal electrode film / silica glass substrate was used to characterize k15 by a resonant spectrum method. For example, the (1120) textured ZnO piezoelectric films with good crystallite alignment show an electromechanical coupling coefficient k 15 of 0.24 which is 92% of the value of single-crystalline (k 15 = 0.26).
AB - The ZnO film, whose crystallites c-axis align parallel to the substrate plane [(112̄0) textured ZnO films], has many potential advantages as shear-mode piezoelectric devices. In this study, shear mode electromechanical coupling coefficient k15 of (112̄0) textured polycrystalline ZnO films was estimated. An over-moded resonator consists of metal electrode film / (112̄0) textured ZnO piezoelectric film / metal electrode film / silica glass substrate was used to characterize k15 by a resonant spectrum method. For example, the (1120) textured ZnO piezoelectric films with good crystallite alignment show an electromechanical coupling coefficient k 15 of 0.24 which is 92% of the value of single-crystalline (k 15 = 0.26).
KW - (11-20) textured ZnO piezoelectric films
KW - Electromechnical coupling coefficient
KW - Shear mode FBAR
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UR - http://www.scopus.com/inward/citedby.url?scp=33847128345&partnerID=8YFLogxK
U2 - 10.1109/ULTSYM.2005.1603223
DO - 10.1109/ULTSYM.2005.1603223
M3 - Conference contribution
AN - SCOPUS:33847128345
SN - 0780393821
SN - 9780780393820
T3 - Proceedings - IEEE Ultrasonics Symposium
SP - 1824
EP - 1827
BT - 2005 IEEE Ultrasonics Symposium
T2 - 2005 IEEE Ultrasonics Symposium
Y2 - 18 September 2005 through 21 September 2005
ER -