ESR study for ion beam induced phenomena in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP)

Taeko Yoshikawa, Akihiro Oshima*, Takeshi Murakami, Masakazu Washio

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


Trapped radicals induced in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP) were observed by X-band electron spin resonance (ESR) spectroscopy at room temperature (RT) under atmospheric field after an irradiation with various kinds of high energy ion beams (6MeV/u). The irradiation was carried out to a stacked FEP films under vacuum (<4E-4Pa) at RT with various fluences from 1.0×10 9 to 1.0×10 11ions/cm 2. All ESR spectra indicated an existence of peroxy radicals in each of the FEP films without any relation to a kind of ion and a penetration depth. Obtained depth profiles of radical concentrations induced with each ion beam almost correspond to those of stopping power. The trapped radical concentrations were strongly dependent on stopping power. It was found that G-value of trapped radicals by ion beam irradiation was decreased with increasing a stopping power, and was less than the case of gamma-rays irradiation.

Original languageEnglish
Pages (from-to)1904-1909
Number of pages6
JournalRadiation Physics and Chemistry
Issue number12
Publication statusPublished - 2012 Dec


  • ESR
  • FEP
  • G-value
  • Ion beam
  • Stopping power
  • Trapped radical

ASJC Scopus subject areas

  • Radiation


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