ESR study for ion beam induced phenomena in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP)

Taeko Yoshikawa; Akihiro Oshima; Takeshi Murakami; Masakazu Washio

doi:10.1016/j.radphyschem.2012.08.001

ESR study for ion beam induced phenomena in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP)

Taeko Yoshikawa, Akihiro Oshima^*, Takeshi Murakami, Masakazu Washio

^*Corresponding author for this work

School of Advanced Science and Engineering

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Trapped radicals induced in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP) were observed by X-band electron spin resonance (ESR) spectroscopy at room temperature (RT) under atmospheric field after an irradiation with various kinds of high energy ion beams (6MeV/u). The irradiation was carried out to a stacked FEP films under vacuum (<4E-4Pa) at RT with various fluences from 1.0×10 ⁹ to 1.0×10 ¹¹ions/cm ². All ESR spectra indicated an existence of peroxy radicals in each of the FEP films without any relation to a kind of ion and a penetration depth. Obtained depth profiles of radical concentrations induced with each ion beam almost correspond to those of stopping power. The trapped radical concentrations were strongly dependent on stopping power. It was found that G-value of trapped radicals by ion beam irradiation was decreased with increasing a stopping power, and was less than the case of gamma-rays irradiation.

Original language	English
Pages (from-to)	1904-1909
Number of pages	6
Journal	Radiation Physics and Chemistry
Volume	81
Issue number	12
DOIs	https://doi.org/10.1016/j.radphyschem.2012.08.001
Publication status	Published - 2012 Dec

Keywords

ESR
FEP
G-value
Ion beam
Stopping power
Trapped radical

ASJC Scopus subject areas

Radiation

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10.1016/j.radphyschem.2012.08.001

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@article{f358a7ce9c6d42e9a1e261f5b11c2a02,

title = "ESR study for ion beam induced phenomena in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP)",

abstract = "Trapped radicals induced in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP) were observed by X-band electron spin resonance (ESR) spectroscopy at room temperature (RT) under atmospheric field after an irradiation with various kinds of high energy ion beams (6MeV/u). The irradiation was carried out to a stacked FEP films under vacuum (<4E-4Pa) at RT with various fluences from 1.0×10 9 to 1.0×10 11ions/cm 2. All ESR spectra indicated an existence of peroxy radicals in each of the FEP films without any relation to a kind of ion and a penetration depth. Obtained depth profiles of radical concentrations induced with each ion beam almost correspond to those of stopping power. The trapped radical concentrations were strongly dependent on stopping power. It was found that G-value of trapped radicals by ion beam irradiation was decreased with increasing a stopping power, and was less than the case of gamma-rays irradiation.",

keywords = "ESR, FEP, G-value, Ion beam, Stopping power, Trapped radical",

author = "Taeko Yoshikawa and Akihiro Oshima and Takeshi Murakami and Masakazu Washio",

note = "Funding Information: This study was supported by the research project with heavy ions at NIRS-HIMAC (H186). The authors acknowledge staff members of HIMAC operation division and accelerator engineering company for experiments using high energy ion beam irradiation. A part of this work (A. Oshima) was supported by a Grant-in-Aid for young Scientist (A) 21686087 from the Japan Society for the promotion of science (JSPS) . ",

year = "2012",

month = dec,

doi = "10.1016/j.radphyschem.2012.08.001",

language = "English",

volume = "81",

pages = "1904--1909",

journal = "Radiation Physics and Chemistry",

issn = "0969-806X",

publisher = "Elsevier Limited",

number = "12",

}

TY - JOUR

T1 - ESR study for ion beam induced phenomena in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP)

AU - Yoshikawa, Taeko

AU - Oshima, Akihiro

AU - Murakami, Takeshi

AU - Washio, Masakazu

N1 - Funding Information: This study was supported by the research project with heavy ions at NIRS-HIMAC (H186). The authors acknowledge staff members of HIMAC operation division and accelerator engineering company for experiments using high energy ion beam irradiation. A part of this work (A. Oshima) was supported by a Grant-in-Aid for young Scientist (A) 21686087 from the Japan Society for the promotion of science (JSPS) .

PY - 2012/12

Y1 - 2012/12

N2 - Trapped radicals induced in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP) were observed by X-band electron spin resonance (ESR) spectroscopy at room temperature (RT) under atmospheric field after an irradiation with various kinds of high energy ion beams (6MeV/u). The irradiation was carried out to a stacked FEP films under vacuum (<4E-4Pa) at RT with various fluences from 1.0×10 9 to 1.0×10 11ions/cm 2. All ESR spectra indicated an existence of peroxy radicals in each of the FEP films without any relation to a kind of ion and a penetration depth. Obtained depth profiles of radical concentrations induced with each ion beam almost correspond to those of stopping power. The trapped radical concentrations were strongly dependent on stopping power. It was found that G-value of trapped radicals by ion beam irradiation was decreased with increasing a stopping power, and was less than the case of gamma-rays irradiation.

AB - Trapped radicals induced in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP) were observed by X-band electron spin resonance (ESR) spectroscopy at room temperature (RT) under atmospheric field after an irradiation with various kinds of high energy ion beams (6MeV/u). The irradiation was carried out to a stacked FEP films under vacuum (<4E-4Pa) at RT with various fluences from 1.0×10 9 to 1.0×10 11ions/cm 2. All ESR spectra indicated an existence of peroxy radicals in each of the FEP films without any relation to a kind of ion and a penetration depth. Obtained depth profiles of radical concentrations induced with each ion beam almost correspond to those of stopping power. The trapped radical concentrations were strongly dependent on stopping power. It was found that G-value of trapped radicals by ion beam irradiation was decreased with increasing a stopping power, and was less than the case of gamma-rays irradiation.

KW - ESR

KW - FEP

KW - G-value

KW - Ion beam

KW - Stopping power

KW - Trapped radical

UR - http://www.scopus.com/inward/record.url?scp=84867214994&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84867214994&partnerID=8YFLogxK

U2 - 10.1016/j.radphyschem.2012.08.001

DO - 10.1016/j.radphyschem.2012.08.001

M3 - Article

AN - SCOPUS:84867214994

SN - 0969-806X

VL - 81

SP - 1904

EP - 1909

JO - Radiation Physics and Chemistry

JF - Radiation Physics and Chemistry

IS - 12

ER -

ESR study for ion beam induced phenomena in poly (tetrafluoroethylene-co-hexafluoropropylene) (FEP)

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