Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz

Naoko Ono; Kyoya Takano; Mizuki Motoyoshi; Kosuke Katayama; Minoru Fujishima

Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz

Naoko Ono^*, Kyoya Takano, Mizuki Motoyoshi, Kosuke Katayama, Minoru Fujishima

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The accuracy of de-embedding techniques depending on de-embedding layout patterns has been verified by experiment up to 110 GHz for CMOS circuits. The accuracy of the measured characteristics is affected significantly by the de-embedding procedure, which has been done for the raw measurement data. The de-embedding patterns and some transmission lines (TL) as test device were designed and fabricated using 40 nm CMOS process. From the experiment results, it was confirmed that each characteristic of the TL, such as propagation constant and characteristic impedance, has a different suitable de-embedding pattern to set a reference plane at a different desired position.

Original language	English
Title of host publication	European Microwave Week 2012
Subtitle of host publication	"Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012
Pages	548-551
Number of pages	4
Publication status	Published - 2012 Dec 1
Externally published	Yes
Event	7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 - Amsterdam, Netherlands Duration: 2012 Oct 29 → 2012 Oct 30

Publication series

Name	European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012

Other

Other	7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012
Country/Territory	Netherlands
City	Amsterdam
Period	12/10/29 → 12/10/30

Keywords

W band
de-embed
millimeter wave technology
reference plane
transmission lines

ASJC Scopus subject areas

Hardware and Architecture

Cite this

Ono, N., Takano, K., Motoyoshi, M., Katayama, K., & Fujishima, M. (2012). Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. In European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012 (pp. 548-551). Article 6483858 (European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012).

Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. / Ono, Naoko; Takano, Kyoya; Motoyoshi, Mizuki et al.
European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012. 2012. p. 548-551 6483858 (European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ono, N, Takano, K, Motoyoshi, M, Katayama, K & Fujishima, M 2012, Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. in European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012., 6483858, European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012, pp. 548-551, 7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012, Amsterdam, Netherlands, 12/10/29.

Ono N, Takano K, Motoyoshi M, Katayama K, Fujishima M. Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. In European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012. 2012. p. 548-551. 6483858. (European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012).

Ono, Naoko ; Takano, Kyoya ; Motoyoshi, Mizuki et al. / Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz. European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012. 2012. pp. 548-551 (European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012).

@inproceedings{d0db5f5ca51b4201ae41c8640f84518f,

title = "Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz",

abstract = "The accuracy of de-embedding techniques depending on de-embedding layout patterns has been verified by experiment up to 110 GHz for CMOS circuits. The accuracy of the measured characteristics is affected significantly by the de-embedding procedure, which has been done for the raw measurement data. The de-embedding patterns and some transmission lines (TL) as test device were designed and fabricated using 40 nm CMOS process. From the experiment results, it was confirmed that each characteristic of the TL, such as propagation constant and characteristic impedance, has a different suitable de-embedding pattern to set a reference plane at a different desired position.",

keywords = "W band, de-embed, millimeter wave technology, reference plane, transmission lines",

author = "Naoko Ono and Kyoya Takano and Mizuki Motoyoshi and Kosuke Katayama and Minoru Fujishima",

year = "2012",

month = dec,

day = "1",

language = "English",

isbn = "9782874870286",

series = "European Microwave Week 2012: {"}Space for Microwaves{"}, EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012",

pages = "548--551",

booktitle = "European Microwave Week 2012",

note = "7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 ; Conference date: 29-10-2012 Through 30-10-2012",

}

TY - GEN

T1 - Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz

AU - Ono, Naoko

AU - Takano, Kyoya

AU - Motoyoshi, Mizuki

AU - Katayama, Kosuke

AU - Fujishima, Minoru

PY - 2012/12/1

Y1 - 2012/12/1

N2 - The accuracy of de-embedding techniques depending on de-embedding layout patterns has been verified by experiment up to 110 GHz for CMOS circuits. The accuracy of the measured characteristics is affected significantly by the de-embedding procedure, which has been done for the raw measurement data. The de-embedding patterns and some transmission lines (TL) as test device were designed and fabricated using 40 nm CMOS process. From the experiment results, it was confirmed that each characteristic of the TL, such as propagation constant and characteristic impedance, has a different suitable de-embedding pattern to set a reference plane at a different desired position.

AB - The accuracy of de-embedding techniques depending on de-embedding layout patterns has been verified by experiment up to 110 GHz for CMOS circuits. The accuracy of the measured characteristics is affected significantly by the de-embedding procedure, which has been done for the raw measurement data. The de-embedding patterns and some transmission lines (TL) as test device were designed and fabricated using 40 nm CMOS process. From the experiment results, it was confirmed that each characteristic of the TL, such as propagation constant and characteristic impedance, has a different suitable de-embedding pattern to set a reference plane at a different desired position.

KW - W band

KW - de-embed

KW - millimeter wave technology

KW - reference plane

KW - transmission lines

UR - http://www.scopus.com/inward/record.url?scp=84875963640&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84875963640&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84875963640

SN - 9782874870286

T3 - European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012

SP - 548

EP - 551

BT - European Microwave Week 2012

T2 - 7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012

Y2 - 29 October 2012 through 30 October 2012

ER -

Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this