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Evaluation of soft-error hardness of DRAMs undei quasi-heavy ion irradiation using he single ion microprobe technique
T. Matsukawa*, S. Mori, T. Tanii, T. T. Ariniura, M. Koh, K. Igarashi, T. Sugimoto, I. Ohdomari
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
5
Citations
(Scopus)