Evaluation of soft errors in DRAM and SRAM using nuclear microprobe and neutron source

M. Takai*, Y. Arita, S. Abo, T. Iwamatsu, S. Maegawa, H. Sayama, Y. Yamaguchi, M. Inuishi, T. Nishimura

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Engineering & Materials Science