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Evaluation of temperature and germanium concentration dependence of EXAFS oscillations in Si-rich silicon germanium thin films
K. Yoshioka*, R. Yokogawa, M. Koharada, H. Takeuchi, G. Ogasawara, I. Hirosawa, T. Watanabe, A. Ogura
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution