TY - JOUR
T1 - Evaluation of the systematic errors of polarimetric measurements
T2 - Application to measurements of the gyration tensors of a-Quartz by the HAUP
AU - Kobayashi, By J.
AU - Asahi, Toru
AU - Takahashi, S.
AU - Glazer, M.
PY - 1988
Y1 - 1988
N2 - Ft was shown in the course of developing the high- Accuracy universal polarimctcr (HAUP) that any polarimetric optical analyses cannot be free from a systematic error y originating in the parasitic ellipti- cities of the constituent Nicol prisms. A method by which one can remove y in the HAUP method is presented. This has been successfully applied to measurements of the gyration tensors and birefringence of two enantiomorphic crystals of a-quartz. It was found that the order of magnitude of this error for a polarizer is about 10 4 and consequently y lies between 10-4 and 10-3 in typical optical systems. Our results, g, = 5-7±0-52 x 10-5 and g33 = - 13-6 ± 0-52 x 10-5 with a wavelength of 6328 A for laevo- rotatory quartz at 300 K are in good agreement with some of the previous reports.
AB - Ft was shown in the course of developing the high- Accuracy universal polarimctcr (HAUP) that any polarimetric optical analyses cannot be free from a systematic error y originating in the parasitic ellipti- cities of the constituent Nicol prisms. A method by which one can remove y in the HAUP method is presented. This has been successfully applied to measurements of the gyration tensors and birefringence of two enantiomorphic crystals of a-quartz. It was found that the order of magnitude of this error for a polarizer is about 10 4 and consequently y lies between 10-4 and 10-3 in typical optical systems. Our results, g, = 5-7±0-52 x 10-5 and g33 = - 13-6 ± 0-52 x 10-5 with a wavelength of 6328 A for laevo- rotatory quartz at 300 K are in good agreement with some of the previous reports.
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U2 - 10.1107/S0021889888005503
DO - 10.1107/S0021889888005503
M3 - Article
AN - SCOPUS:84983770953
SN - 0021-8898
VL - 21
SP - 479
EP - 484
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
IS - 5
ER -