TY - GEN
T1 - Extremely durable CD-ROM with a novel structure
AU - Yamaguchi, H.
AU - Tsukamoto, Y.
AU - Watanabe, F.
AU - Sato, A.
AU - Saito, M.
AU - Honda, H.
AU - Murahata, M.
AU - Yanagisawa, M.
AU - Tsuno, Toshio
PY - 1991
Y1 - 1991
N2 - This paper describes an extremely durable CD-ROM and its reliability. A pit pattern was fabricated through a sol-gel process utilizing a 2P/epoxy work stamper. Excellent stability was guaranteed by a layered structure, such as the SiO2-ZrO2 overcoat on a chemical strengthening glass substrate and the Si/SiO2-ZrO2/Cr tri-layered reflector on a sol-gel layer. Accelerated tests were implemented to estimate its lifetime. The CD-ROM lifetime at 30°C and 90% RH was estimated to be more than 300 years. This exceedingly long lifetime was determined on the basis of the following two experimental results. Little degradation was observed in Cl error rate during about 50 days at 120°C and 90% RH. A main degradation mode, which was observed on longer aging, was Cr film peeling-off. It was found that activation energy for the Cr peeling-off process was 0.91 eV by an in-situ peeling detection tester, based on the acoustic emission method.
AB - This paper describes an extremely durable CD-ROM and its reliability. A pit pattern was fabricated through a sol-gel process utilizing a 2P/epoxy work stamper. Excellent stability was guaranteed by a layered structure, such as the SiO2-ZrO2 overcoat on a chemical strengthening glass substrate and the Si/SiO2-ZrO2/Cr tri-layered reflector on a sol-gel layer. Accelerated tests were implemented to estimate its lifetime. The CD-ROM lifetime at 30°C and 90% RH was estimated to be more than 300 years. This exceedingly long lifetime was determined on the basis of the following two experimental results. Little degradation was observed in Cl error rate during about 50 days at 120°C and 90% RH. A main degradation mode, which was observed on longer aging, was Cr film peeling-off. It was found that activation energy for the Cr peeling-off process was 0.91 eV by an in-situ peeling detection tester, based on the acoustic emission method.
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U2 - 10.1117/12.45913
DO - 10.1117/12.45913
M3 - Conference contribution
AN - SCOPUS:0026369341
SN - 0819406082
SN - 9780819406088
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 29
EP - 38
BT - Proceedings of SPIE - The International Society for Optical Engineering
PB - Publ by Int Soc for Optical Engineering
T2 - Optical Data Storage '91
Y2 - 25 February 1991 through 27 February 1991
ER -