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Fabrication of diamond MISFET with micron-sized gate length on boron-doped (111) surface
Takeyasu Saito*, Kyung Ho Park, Kazuyuki Hirama, Hitoshi Umezawa, Mitsuya Satoh, Hiroshi Kawarada, Hideyo Okushi
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
11
Citations
(Scopus)