Abstract
We show that epitaxial Co2MnSi films can be fabricated on lattice-matched MgAl2O4 substrates using an ion-beam-assisted sputtering method. Low temperature growth below ~ 500 °C with Ar ion-beam assistance enabled high-quality Co2MnSi films with ideal saturation magnetization and highly-ordered L21 structures. The Co2MnSi films also demonstrated a negative anisotropic magnetoresistance of ~ 0.1% at room temperature, which is a typical characteristic of half-metals. These results suggest that ion-beam assisted sputtering is an effective method of fabricating high-quality, half-metallic Co2MnSi films at low growth temperatures.
Original language | English |
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Pages (from-to) | 134-137 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 570 |
Issue number | PartA |
DOIs | |
Publication status | Published - 2014 Nov 3 |
Externally published | Yes |
Keywords
- Cobalt manganese silicon
- Half-metal
- Heusler alloy
- Ion-beam assisted sputtering
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry