Fast Hyperparameter Tuning for Ising Machines

Matthieu Parizy, Norihiro Kakuko, Nozomu Togawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution


In this paper, we propose a novel technique to accelerate Ising machines hyperparameter tuning. Firstly, we define Ising machine performance and explain the goal of hyperparameter tuning in regard to this performance definition. Secondly, we compare well-known hyperparameter tuning techniques, namely random sampling and Treestructured Parzen Estimator (TPE) on different combinatorial optimization problems. Thirdly, we propose a new convergence acceleration method for TPE which we call 'FastConvergence'. It aims at limiting the number of required TPE trials to reach best performing hyperparameter values combination. We compare FastConvergence to previously mentioned well-known hyperparameter tuning techniques to show its effectiveness. For experiments, well-known Travel Salesman Problem (TSP) and Quadratic Assignment Problem (QAP) instances are used as input. The Ising machine used is Fujitsu's third generation Digital Annealer (DA). Results show, in most cases, FastConvergence can reach similar results to TPE alone within less than half the number of trials.

Original languageEnglish
Title of host publication2023 IEEE International Conference on Consumer Electronics, ICCE 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665491303
Publication statusPublished - 2023
Event2023 IEEE International Conference on Consumer Electronics, ICCE 2023 - Las Vegas, United States
Duration: 2023 Jan 62023 Jan 8

Publication series

NameDigest of Technical Papers - IEEE International Conference on Consumer Electronics
ISSN (Print)0747-668X


Conference2023 IEEE International Conference on Consumer Electronics, ICCE 2023
Country/TerritoryUnited States
CityLas Vegas


  • hyperparameter tuning
  • Ising machine
  • optimization

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering


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