Fault diagnosis method using a signed digraph for multiple origins of failures - Evaluation of the diagnosis accuracy

Shigeyuki Tateno; Hisayoshi Matsuyama; Yoshifumi Tsuge

doi:10.1109/CCA.2006.286152

Fault diagnosis method using a signed digraph for multiple origins of failures - Evaluation of the diagnosis accuracy

Shigeyuki Tateno^*, Hisayoshi Matsuyama, Yoshifumi Tsuge

^*Corresponding author for this work

Graduate School of Information, Production and Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

A fault diagnosis algorithm using a signed digraph as a model of a system is useful to real-time diagnosis of failures that occur in a chemical plant. It has been improved so much that it can find multiple origins of failures that occur in the plant at the same time. It is imperative that the diagnosis system be evaluated in the design phase of the system in advance for its practical use. In this paper, an accuracy of diagnostic results using the algorithm for multiple origins has been examined by its application to data obtained by the simulation of tank pipeline systems. The accuracy of diagnosis has been evaluated properly by the size of the greatest set of candidates.

Original language	English
Title of host publication	Proceedings of the 2006 IEEE International Conference on Control Applications
Pages	3271-3276
Number of pages	6
DOIs	https://doi.org/10.1109/CCA.2006.286152
Publication status	Published - 2007
Event	Joint 2006 IEEE Conference on Control Applications (CCA), Computer-Aided Control Systems Design Symposium (CACSD) and International Symposium on Intelligent Control (ISIC) - Munich, Germany Duration: 2006 Oct 4 → 2006 Oct 6

Publication series

Name	Proceedings of the IEEE International Conference on Control Applications

Conference

Conference	Joint 2006 IEEE Conference on Control Applications (CCA), Computer-Aided Control Systems Design Symposium (CACSD) and International Symposium on Intelligent Control (ISIC)
Country/Territory	Germany
City	Munich
Period	06/10/4 → 06/10/6

ASJC Scopus subject areas

Engineering(all)

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10.1109/CCA.2006.286152

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Tateno, S., Matsuyama, H., & Tsuge, Y. (2007). Fault diagnosis method using a signed digraph for multiple origins of failures - Evaluation of the diagnosis accuracy. In Proceedings of the 2006 IEEE International Conference on Control Applications (pp. 3271-3276). [4067591] (Proceedings of the IEEE International Conference on Control Applications). https://doi.org/10.1109/CCA.2006.286152

Fault diagnosis method using a signed digraph for multiple origins of failures - Evaluation of the diagnosis accuracy. / Tateno, Shigeyuki; Matsuyama, Hisayoshi; Tsuge, Yoshifumi.
Proceedings of the 2006 IEEE International Conference on Control Applications. 2007. p. 3271-3276 4067591 (Proceedings of the IEEE International Conference on Control Applications).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tateno, S, Matsuyama, H & Tsuge, Y 2007, Fault diagnosis method using a signed digraph for multiple origins of failures - Evaluation of the diagnosis accuracy. in Proceedings of the 2006 IEEE International Conference on Control Applications., 4067591, Proceedings of the IEEE International Conference on Control Applications, pp. 3271-3276, Joint 2006 IEEE Conference on Control Applications (CCA), Computer-Aided Control Systems Design Symposium (CACSD) and International Symposium on Intelligent Control (ISIC), Munich, Germany, 06/10/4. https://doi.org/10.1109/CCA.2006.286152

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Fault diagnosis method using a signed digraph for multiple origins of failures - Evaluation of the diagnosis accuracy

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