FCSCAN: An efficient multiscan-based test compression technique for test cost reduction

Youhua Shi; Nozomu Togawa; Shinji Kimura; Masao Yanagisawa; Tatsuo Ohtsuki

FCSCAN: An efficient multiscan-based test compression technique for test cost reduction

Youhua Shi^*, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

16 Citations (Scopus)

Abstract

This paper proposes a new multiscan-based test input data compression technique by employing a Fan-out Compression Scan Architecture (FCSCAN) for test cost reduction. The basic idea of FCSCAN is to target the minority specified 1 or 0 bits (either 1 or 0) in scan slices for compression. Due to the low specified bit density in test cube set, FCSCAN can significantly reduce input test data volume and the number of required test channels so as to reduce test cost. The FCSCAN technique is easy to be implemented with small hardware overhead and does not need any special ATPG for test generation. In addition, based on the theoretical compression efficiency analysis, improved procedures are also proposed for the FCSCAN to achieve further compression. Experimental results on both benchmark circuits and one real industrial design indicate that drastic reduction in test cost can be indeed achieved.

Original language	English
Title of host publication	Proceedings of the ASP-DAC 2006
Subtitle of host publication	Asia and South Pacific Design Automation Conference 2006
Pages	653-658
Number of pages	6
Publication status	Published - 2006 Sept 19
Event	ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 - Yokohama, Japan Duration: 2006 Jan 24 → 2006 Jan 27

Publication series

Name	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume	2006

Conference

Conference	ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006
Country/Territory	Japan
City	Yokohama
Period	06/1/24 → 06/1/27

ASJC Scopus subject areas

Computer Science Applications
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering

Cite this

Shi, Y., Togawa, N., Kimura, S., Yanagisawa, M., & Ohtsuki, T. (2006). FCSCAN: An efficient multiscan-based test compression technique for test cost reduction. In Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006 (pp. 653-658). Article 1594760 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; Vol. 2006).

FCSCAN: An efficient multiscan-based test compression technique for test cost reduction. / Shi, Youhua ; Togawa, Nozomu ; Kimura, Shinji et al.
Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006. 2006. p. 653-658 1594760 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; Vol. 2006).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Shi, Y , Togawa, N , Kimura, S , Yanagisawa, M & Ohtsuki, T 2006, FCSCAN: An efficient multiscan-based test compression technique for test cost reduction. in Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006., 1594760, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, vol. 2006, pp. 653-658, ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006, Yokohama, Japan, 06/1/24.

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FCSCAN: An efficient multiscan-based test compression technique for test cost reduction

Abstract

Publication series

Conference

ASJC Scopus subject areas

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