Fidelity of near-field intensity distribution of surface plasmon on slightly rough surfaces

Tetsuya Kawanishi*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.

Original languageEnglish
Pages (from-to)2065-2070
Number of pages6
JournalIEICE Transactions on Electronics
VolumeE85-C
Issue number12 SPEC.
Publication statusPublished - 2002 Dec
Externally publishedYes

Keywords

  • Functional
  • Near-field
  • Plasmon
  • Scattering
  • Stochastic

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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