Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.
|Number of pages
|IEICE Transactions on Electronics
|Published - 2002 Dec
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering