Fine transmittance/reflectivity measurement system using single- sideband frequency sweeper with ultra-wideband hilbert transformer

Tetsuya Kawanishi*, Takahide Sakamoto, Daniel Fonseca, Adolfo Cartaxo, Paulo Monteiro, Masayuki Lzutsu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Citations (Scopus)

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Engineering & Materials Science