First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

M. Usami; N. Edagawa; Yuichi Matsushima; H. Horie; T. Fujimori; I. Sakamoto; H. Gotoh

First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

M. Usami^*, N. Edagawa, Yuichi Matsushima, H. Horie, T. Fujimori, I. Sakamoto, H. Gotoh

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Chapter

2 Citations (Scopus)

Abstract

Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

Original language	English
Title of host publication	Conference on Optical Fiber Communication, Technical Digest Series
Place of Publication	Piscataway, NJ, United States
Publisher	IEEE
Publication status	Published - 1999
Externally published	Yes

ASJC Scopus subject areas

Computer Science(all)
Engineering(all)

Cite this

@inbook{e324513439434e39950bf64ba36d5ae2,

title = "First undersea-qualified 980 nm pump laser diode module evaluated with massive life test",

abstract = "Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.",

author = "M. Usami and N. Edagawa and Yuichi Matsushima and H. Horie and T. Fujimori and I. Sakamoto and H. Gotoh",

year = "1999",

language = "English",

booktitle = "Conference on Optical Fiber Communication, Technical Digest Series",

publisher = "IEEE",

}

TY - CHAP

T1 - First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

AU - Usami, M.

AU - Edagawa, N.

AU - Matsushima, Yuichi

AU - Horie, H.

AU - Fujimori, T.

AU - Sakamoto, I.

AU - Gotoh, H.

PY - 1999

Y1 - 1999

N2 - Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

AB - Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

UR - http://www.scopus.com/inward/record.url?scp=0032668881&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032668881&partnerID=8YFLogxK

M3 - Chapter

AN - SCOPUS:0032668881

BT - Conference on Optical Fiber Communication, Technical Digest Series

PB - IEEE

CY - Piscataway, NJ, United States

ER -

First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

Abstract

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this