Fluctuations of electron beams emitted from single-atom electron sources prepared with different techniques

Tsuyoshi Ishikawa; Keisuke Tagawa; Tomohiro Urata; Chuhei Oshima; Boklae Cho; Eiji Rokuta

doi:10.1380/ejssnt.2008.11

Fluctuations of electron beams emitted from single-atom electron sources prepared with different techniques

Tsuyoshi Ishikawa^*, Keisuke Tagawa, Tomohiro Urata, Chuhei Oshima, Boklae Cho, Eiji Rokuta

^*Corresponding author for this work

Waseda University

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

We compared fluctuations of electron beams emitted from single-atom electron sources, on which the surface Pd metals were deposited by two different techniques, vacuum deposition and electroplating deposition. The similar nano-pyramids were fabricated successfully by both the techniques, but the stabilities of the beam currents were different each other; the electron source prepared by vacuum deposition was far superior to those of electroplating deposition. The possible origin was discussed on the basis of AES analysis.

Original language	English
Pages (from-to)	11-14
Number of pages	4
Journal	e-Journal of Surface Science and Nanotechnology
Volume	6
DOIs	https://doi.org/10.1380/ejssnt.2008.11
Publication status	Published - 2008 Jan 18

Keywords

Electron emission
Extreme High Vacuum (XHV)
Field emission microscopy
Scanning Electron Microscopy (SEM)
Single-atom electron source

ASJC Scopus subject areas

Surfaces, Coatings and Films
Materials Science (miscellaneous)

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10.1380/ejssnt.2008.11

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title = "Fluctuations of electron beams emitted from single-atom electron sources prepared with different techniques",

abstract = "We compared fluctuations of electron beams emitted from single-atom electron sources, on which the surface Pd metals were deposited by two different techniques, vacuum deposition and electroplating deposition. The similar nano-pyramids were fabricated successfully by both the techniques, but the stabilities of the beam currents were different each other; the electron source prepared by vacuum deposition was far superior to those of electroplating deposition. The possible origin was discussed on the basis of AES analysis.",

keywords = "Electron emission, Extreme High Vacuum (XHV), Field emission microscopy, Scanning Electron Microscopy (SEM), Single-atom electron source",

author = "Tsuyoshi Ishikawa and Keisuke Tagawa and Tomohiro Urata and Chuhei Oshima and Boklae Cho and Eiji Rokuta",

year = "2008",

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T1 - Fluctuations of electron beams emitted from single-atom electron sources prepared with different techniques

AU - Ishikawa, Tsuyoshi

AU - Tagawa, Keisuke

AU - Urata, Tomohiro

AU - Oshima, Chuhei

AU - Cho, Boklae

AU - Rokuta, Eiji

PY - 2008/1/18

Y1 - 2008/1/18

N2 - We compared fluctuations of electron beams emitted from single-atom electron sources, on which the surface Pd metals were deposited by two different techniques, vacuum deposition and electroplating deposition. The similar nano-pyramids were fabricated successfully by both the techniques, but the stabilities of the beam currents were different each other; the electron source prepared by vacuum deposition was far superior to those of electroplating deposition. The possible origin was discussed on the basis of AES analysis.

AB - We compared fluctuations of electron beams emitted from single-atom electron sources, on which the surface Pd metals were deposited by two different techniques, vacuum deposition and electroplating deposition. The similar nano-pyramids were fabricated successfully by both the techniques, but the stabilities of the beam currents were different each other; the electron source prepared by vacuum deposition was far superior to those of electroplating deposition. The possible origin was discussed on the basis of AES analysis.

KW - Electron emission

KW - Extreme High Vacuum (XHV)

KW - Field emission microscopy

KW - Scanning Electron Microscopy (SEM)

KW - Single-atom electron source

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DO - 10.1380/ejssnt.2008.11

M3 - Article

AN - SCOPUS:39449107460

SN - 1348-0391

VL - 6

SP - 11

EP - 14

JO - e-Journal of Surface Science and Nanotechnology

JF - e-Journal of Surface Science and Nanotechnology

ER -

Fluctuations of electron beams emitted from single-atom electron sources prepared with different techniques

Abstract

Keywords

ASJC Scopus subject areas

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