Growth and structural characterization of molecular superlattice of quaterrylene and N,N′-dioctyl-3,4,9,10-perylenedicarboximide

Nobuya Hiroshiba; Ryoma Hayakawa; Matthieu Petit; Toyohiro Chikyow; Kiyoto Matsuishi; Yutaka Wakayama

doi:10.1016/j.orgel.2009.05.010

Growth and structural characterization of molecular superlattice of quaterrylene and N,N′-dioctyl-3,4,9,10-perylenedicarboximide

Nobuya Hiroshiba, Ryoma Hayakawa, Matthieu Petit, Toyohiro Chikyow, Kiyoto Matsuishi, Yutaka Wakayama^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

A molecular superlattice consisting of alternate layers of N,N′-dioctyl-3,4,9,10-perylenedicarboximide (PTCDI-C₈) and quaterrylene was prepared by using an ultra-slow deposition technique. Film growth under equilibrium conditions with precise optimization of the substrate temperature enabled the layer-by-layer stacking of hetero-molecules at a single-layer level. The morphology of the films and the orientation of the molecules in each layer were analyzed by atomic force microscopy (AFM) and an X-ray reflection (XRR) technique.

Original language	English
Pages (from-to)	1032-1036
Number of pages	5
Journal	Organic Electronics: physics, materials, applications
Volume	10
Issue number	5
DOIs	https://doi.org/10.1016/j.orgel.2009.05.010
Publication status	Published - 2009 Aug 1
Externally published	Yes

Keywords

Organic semiconductor
Superlattice
Ultra-slow deposition
X-ray reflectometry

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Biomaterials
Chemistry(all)
Condensed Matter Physics
Materials Chemistry
Electrical and Electronic Engineering

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10.1016/j.orgel.2009.05.010

Cite this

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title = "Growth and structural characterization of molecular superlattice of quaterrylene and N,N′-dioctyl-3,4,9,10-perylenedicarboximide",

abstract = "A molecular superlattice consisting of alternate layers of N,N′-dioctyl-3,4,9,10-perylenedicarboximide (PTCDI-C8) and quaterrylene was prepared by using an ultra-slow deposition technique. Film growth under equilibrium conditions with precise optimization of the substrate temperature enabled the layer-by-layer stacking of hetero-molecules at a single-layer level. The morphology of the films and the orientation of the molecules in each layer were analyzed by atomic force microscopy (AFM) and an X-ray reflection (XRR) technique.",

keywords = "Organic semiconductor, Superlattice, Ultra-slow deposition, X-ray reflectometry",

author = "Nobuya Hiroshiba and Ryoma Hayakawa and Matthieu Petit and Toyohiro Chikyow and Kiyoto Matsuishi and Yutaka Wakayama",

year = "2009",

month = aug,

day = "1",

doi = "10.1016/j.orgel.2009.05.010",

language = "English",

volume = "10",

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T1 - Growth and structural characterization of molecular superlattice of quaterrylene and N,N′-dioctyl-3,4,9,10-perylenedicarboximide

AU - Hiroshiba, Nobuya

AU - Hayakawa, Ryoma

AU - Petit, Matthieu

AU - Chikyow, Toyohiro

AU - Matsuishi, Kiyoto

AU - Wakayama, Yutaka

PY - 2009/8/1

Y1 - 2009/8/1

N2 - A molecular superlattice consisting of alternate layers of N,N′-dioctyl-3,4,9,10-perylenedicarboximide (PTCDI-C8) and quaterrylene was prepared by using an ultra-slow deposition technique. Film growth under equilibrium conditions with precise optimization of the substrate temperature enabled the layer-by-layer stacking of hetero-molecules at a single-layer level. The morphology of the films and the orientation of the molecules in each layer were analyzed by atomic force microscopy (AFM) and an X-ray reflection (XRR) technique.

AB - A molecular superlattice consisting of alternate layers of N,N′-dioctyl-3,4,9,10-perylenedicarboximide (PTCDI-C8) and quaterrylene was prepared by using an ultra-slow deposition technique. Film growth under equilibrium conditions with precise optimization of the substrate temperature enabled the layer-by-layer stacking of hetero-molecules at a single-layer level. The morphology of the films and the orientation of the molecules in each layer were analyzed by atomic force microscopy (AFM) and an X-ray reflection (XRR) technique.

KW - Organic semiconductor

KW - Superlattice

KW - Ultra-slow deposition

KW - X-ray reflectometry

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DO - 10.1016/j.orgel.2009.05.010

M3 - Article

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JO - Organic Electronics: physics, materials, applications

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ER -

Growth and structural characterization of molecular superlattice of quaterrylene and N,N′-dioctyl-3,4,9,10-perylenedicarboximide

Abstract

Keywords

ASJC Scopus subject areas

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