TY - GEN
T1 - High temperature resistant interconnection for SiC power devices using Ni micro-electroplating and Ni nano particles
AU - Tatsumi, Kohei
AU - Tanaka, Yasunori
AU - Iizuka, Tomonori
AU - Wada, Keiko
AU - Fukumori, Minoru
AU - Morisako, Isamu
AU - Jeongbin, Yoon
AU - Murakawa, Norihiro
N1 - Funding Information:
ACKNOWLEDGMENT This work was partly supported by Council for Science, Technology and Innovation (CSTI), Cross-ministerial Strategic Innovation Promotion Program (SIP), “Next-generation power electronics” (funding agency: NEDO).
Publisher Copyright:
© 2018 IEEE.
PY - 2018/11/26
Y1 - 2018/11/26
N2 - Recently there are high expectations for incorporating silicon carbide (SiC) devices as power modules in hybrid electric vehicles (HEV) and electric vehicles (EV). The need for new bonding technologies, which can deliver high-temperature thermal resistance that replaces solder bonding or Al wire bonding, has been strongly expected in order to maximize the performance of SiC power device. We developed a new micro-plating interconnection technology named Nickel Micro Plating Bonding (NMPB), which enables the interconnection in a narrow space between electrodes and SiC devices via our new lead frame formed in chevron shape. As for the bonding strength of NMPB, sufficient joint strength value is confirmed by shear test. We also newly proposed low-temperature nickel nanoparticle sintering to form die bonding connections. We have confirmed that bonding at a bonding temperature of 400 °C or lower is possible, and that it is a bonding having long-term high heat resistance. We implemented heat resistant mounting of SiC schottky barrier diode (SBD) on the TO247 type package and confirmed the I-V characteristics even after the high temperature storage at 300 °C without any significant degradation. We clarified that these methods had adequate potential as an advanced heat resistant package in comparison with conventional interconnections.
AB - Recently there are high expectations for incorporating silicon carbide (SiC) devices as power modules in hybrid electric vehicles (HEV) and electric vehicles (EV). The need for new bonding technologies, which can deliver high-temperature thermal resistance that replaces solder bonding or Al wire bonding, has been strongly expected in order to maximize the performance of SiC power device. We developed a new micro-plating interconnection technology named Nickel Micro Plating Bonding (NMPB), which enables the interconnection in a narrow space between electrodes and SiC devices via our new lead frame formed in chevron shape. As for the bonding strength of NMPB, sufficient joint strength value is confirmed by shear test. We also newly proposed low-temperature nickel nanoparticle sintering to form die bonding connections. We have confirmed that bonding at a bonding temperature of 400 °C or lower is possible, and that it is a bonding having long-term high heat resistance. We implemented heat resistant mounting of SiC schottky barrier diode (SBD) on the TO247 type package and confirmed the I-V characteristics even after the high temperature storage at 300 °C without any significant degradation. We clarified that these methods had adequate potential as an advanced heat resistant package in comparison with conventional interconnections.
KW - High temperature reliability
KW - Interconnection
KW - Ni micro-plating
KW - Ni nanoparticle
KW - Power module
KW - SiC
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U2 - 10.1109/ESTC.2018.8546378
DO - 10.1109/ESTC.2018.8546378
M3 - Conference contribution
AN - SCOPUS:85060064177
T3 - 2018 7th Electronic System-Integration Technology Conference, ESTC 2018 - Proceedings
BT - 2018 7th Electronic System-Integration Technology Conference, ESTC 2018 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th Electronic System-Integration Technology Conference, ESTC 2018
Y2 - 18 September 2018 through 21 September 2018
ER -