TY - GEN
T1 - Improvement in high-temperature dielectric properties of epoxy resin by abundant addition of micro-silica
AU - Hyuga, Mayumi
AU - Tagami, Naoki
AU - Tanaka, Toshikatsu
AU - Ohki, Yoshimichi
AU - Imai, Takahiro
AU - Harada, Miyuki
AU - Ochi, Mitsukazu
PY - 2009/12/1
Y1 - 2009/12/1
N2 - Effects of addition of micro-sized silica fillers and/or nano-sized clay fillers into epoxy resin on its dielectric properties were examined. The glass transition intermediate temperature (Tg) was found to show a decrease by the addition of a small amount of nanofillers, while it is increased by the addition of abundant microfillers with and without co-addition of a small amount of nanofillers. At temperatures above Tg, the samples with abundant microfillers were added have low conductivity, low dielectric constant, and low dielectric loss factor regardless of the co-addition of nanofillers.
AB - Effects of addition of micro-sized silica fillers and/or nano-sized clay fillers into epoxy resin on its dielectric properties were examined. The glass transition intermediate temperature (Tg) was found to show a decrease by the addition of a small amount of nanofillers, while it is increased by the addition of abundant microfillers with and without co-addition of a small amount of nanofillers. At temperatures above Tg, the samples with abundant microfillers were added have low conductivity, low dielectric constant, and low dielectric loss factor regardless of the co-addition of nanofillers.
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U2 - 10.1109/CEIDP.2009.5377845
DO - 10.1109/CEIDP.2009.5377845
M3 - Conference contribution
AN - SCOPUS:77949282181
SN - 9781424445592
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 519
EP - 522
BT - CEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena
T2 - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Y2 - 18 October 2009 through 21 October 2009
ER -