Influence of nanoparticle size to the electrical properties of naphthalenediimide on single-walled carbon nanotube wiring

Hirofumi Tanaka; Liu Hong; Minoru Fukumori; Ryota Negishi; Yoshihiro Kobayashi; Daisuke Tanaka; Takuji Ogawa

doi:10.1088/0957-4484/23/21/215701

Influence of nanoparticle size to the electrical properties of naphthalenediimide on single-walled carbon nanotube wiring

Hirofumi Tanaka^*, Liu Hong, Minoru Fukumori, Ryota Negishi, Yoshihiro Kobayashi, Daisuke Tanaka, Takuji Ogawa

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

Nanoparticles of N,N′-bis(n-alkyl)tetracarbonatenaphthalenediimide (NDI) were adsorbed on single-walled carbon nanotube (SWNT) wires dispersed on a SiO ₂ substrate. The electrical properties were measured along the long axis of the SWNTs, and in all cases through the nanoparticles showed rectification in semiconducting IV curve. The plateau width of the IV curve through the NDI nanoparticles on metallic SWNTs decreased as the particle size increased, while the rectification ratio increased. The conduction mechanism was changed from tunneling conduction to Schottky-like conduction and their boundary is at about 3nm diameter.

Original language	English
Article number	215701
Journal	Nanotechnology
Volume	23
Issue number	21
DOIs	https://doi.org/10.1088/0957-4484/23/21/215701
Publication status	Published - 2012 Jun 1
Externally published	Yes

ASJC Scopus subject areas

Bioengineering
Chemistry(all)
Materials Science(all)
Mechanics of Materials
Mechanical Engineering
Electrical and Electronic Engineering

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Cite this

@article{ed08f8d6b3424df5a406621dae504f3c,

title = "Influence of nanoparticle size to the electrical properties of naphthalenediimide on single-walled carbon nanotube wiring",

abstract = "Nanoparticles of N,N′-bis(n-alkyl)tetracarbonatenaphthalenediimide (NDI) were adsorbed on single-walled carbon nanotube (SWNT) wires dispersed on a SiO 2 substrate. The electrical properties were measured along the long axis of the SWNTs, and in all cases through the nanoparticles showed rectification in semiconducting IV curve. The plateau width of the IV curve through the NDI nanoparticles on metallic SWNTs decreased as the particle size increased, while the rectification ratio increased. The conduction mechanism was changed from tunneling conduction to Schottky-like conduction and their boundary is at about 3nm diameter.",

author = "Hirofumi Tanaka and Liu Hong and Minoru Fukumori and Ryota Negishi and Yoshihiro Kobayashi and Daisuke Tanaka and Takuji Ogawa",

year = "2012",

month = jun,

day = "1",

doi = "10.1088/0957-4484/23/21/215701",

language = "English",

volume = "23",

journal = "Nanotechnology",

issn = "0957-4484",

publisher = "IOP Publishing Ltd.",

number = "21",

}

TY - JOUR

T1 - Influence of nanoparticle size to the electrical properties of naphthalenediimide on single-walled carbon nanotube wiring

AU - Tanaka, Hirofumi

AU - Hong, Liu

AU - Fukumori, Minoru

AU - Negishi, Ryota

AU - Kobayashi, Yoshihiro

AU - Tanaka, Daisuke

AU - Ogawa, Takuji

PY - 2012/6/1

Y1 - 2012/6/1

N2 - Nanoparticles of N,N′-bis(n-alkyl)tetracarbonatenaphthalenediimide (NDI) were adsorbed on single-walled carbon nanotube (SWNT) wires dispersed on a SiO 2 substrate. The electrical properties were measured along the long axis of the SWNTs, and in all cases through the nanoparticles showed rectification in semiconducting IV curve. The plateau width of the IV curve through the NDI nanoparticles on metallic SWNTs decreased as the particle size increased, while the rectification ratio increased. The conduction mechanism was changed from tunneling conduction to Schottky-like conduction and their boundary is at about 3nm diameter.

AB - Nanoparticles of N,N′-bis(n-alkyl)tetracarbonatenaphthalenediimide (NDI) were adsorbed on single-walled carbon nanotube (SWNT) wires dispersed on a SiO 2 substrate. The electrical properties were measured along the long axis of the SWNTs, and in all cases through the nanoparticles showed rectification in semiconducting IV curve. The plateau width of the IV curve through the NDI nanoparticles on metallic SWNTs decreased as the particle size increased, while the rectification ratio increased. The conduction mechanism was changed from tunneling conduction to Schottky-like conduction and their boundary is at about 3nm diameter.

UR - http://www.scopus.com/inward/record.url?scp=84860612611&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84860612611&partnerID=8YFLogxK

U2 - 10.1088/0957-4484/23/21/215701

DO - 10.1088/0957-4484/23/21/215701

M3 - Article

C2 - 22551735

AN - SCOPUS:84860612611

SN - 0957-4484

VL - 23

JO - Nanotechnology

JF - Nanotechnology

IS - 21

M1 - 215701

ER -

Influence of nanoparticle size to the electrical properties of naphthalenediimide on single-walled carbon nanotube wiring

Abstract

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