Influence of structural parameters on electrical characteristics of schottky tunneling field-effect transistor and its scalability

Yan Wu*, Chunmeng Dou, Feng Wei, Kuniyuki Kakushima, Kenji Ohmori, Parhat Ahmet, Takanobu Watanabe, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Keisaku Yamada, Yoshinori Kataoka, Takeo Hattori, Hiroshi Iwai

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

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