Interdiffusion in ZnSe-ZnTe strained-layer superlattices

Akira Imai; Masakazu Kobayashi; Shiro Dosho; Makoto Kongai; Kiyoshi Takahashi

doi:10.1063/1.341955

Interdiffusion in ZnSe-ZnTe strained-layer superlattices

Akira Imai^*, Masakazu Kobayashi, Shiro Dosho, Makoto Kongai, Kiyoshi Takahashi

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

A detailed study has been made of interdiffusion in ZnSe-ZnTe strained-layer superlattices (SLSs) grown by molecular-beam epitaxy (MBE) at a growth temperature of 320°C. In x-ray diffraction measurements, the satellite peak intensities relative to the zero-order peak intensity decreased with annealing time. The interdiffusion coefficient D was calculated assuming a linear diffusion model. The values of D=3.6×10^- ²¹ to 2.2×10^-19 cm²/s at an annealing temperature of 500°C were obtained for the ZnSe-ZnTe SLSs. In the high-resolution transmission electron microscopy (HRTEM) image of as-grown SLSs, the presence of fine superlattice structures was seen, but for interdiffused samples stripes due to the periodic superlattice structures were not visible and many dislocation lines were observed. These results suggest that the structure of SLSs is significantly modulated by thermal annealing at a temperature higher than the growth temperature.

Original language	English
Pages (from-to)	647-650
Number of pages	4
Journal	Journal of Applied Physics
Volume	64
Issue number	2
DOIs	https://doi.org/10.1063/1.341955
Publication status	Published - 1988
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "Interdiffusion in ZnSe-ZnTe strained-layer superlattices",

abstract = "A detailed study has been made of interdiffusion in ZnSe-ZnTe strained-layer superlattices (SLSs) grown by molecular-beam epitaxy (MBE) at a growth temperature of 320°C. In x-ray diffraction measurements, the satellite peak intensities relative to the zero-order peak intensity decreased with annealing time. The interdiffusion coefficient D was calculated assuming a linear diffusion model. The values of D=3.6×10- 21 to 2.2×10-19 cm2/s at an annealing temperature of 500°C were obtained for the ZnSe-ZnTe SLSs. In the high-resolution transmission electron microscopy (HRTEM) image of as-grown SLSs, the presence of fine superlattice structures was seen, but for interdiffused samples stripes due to the periodic superlattice structures were not visible and many dislocation lines were observed. These results suggest that the structure of SLSs is significantly modulated by thermal annealing at a temperature higher than the growth temperature.",

author = "Akira Imai and Masakazu Kobayashi and Shiro Dosho and Makoto Kongai and Kiyoshi Takahashi",

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T1 - Interdiffusion in ZnSe-ZnTe strained-layer superlattices

AU - Imai, Akira

AU - Kobayashi, Masakazu

AU - Dosho, Shiro

AU - Kongai, Makoto

AU - Takahashi, Kiyoshi

PY - 1988

Y1 - 1988

N2 - A detailed study has been made of interdiffusion in ZnSe-ZnTe strained-layer superlattices (SLSs) grown by molecular-beam epitaxy (MBE) at a growth temperature of 320°C. In x-ray diffraction measurements, the satellite peak intensities relative to the zero-order peak intensity decreased with annealing time. The interdiffusion coefficient D was calculated assuming a linear diffusion model. The values of D=3.6×10- 21 to 2.2×10-19 cm2/s at an annealing temperature of 500°C were obtained for the ZnSe-ZnTe SLSs. In the high-resolution transmission electron microscopy (HRTEM) image of as-grown SLSs, the presence of fine superlattice structures was seen, but for interdiffused samples stripes due to the periodic superlattice structures were not visible and many dislocation lines were observed. These results suggest that the structure of SLSs is significantly modulated by thermal annealing at a temperature higher than the growth temperature.

AB - A detailed study has been made of interdiffusion in ZnSe-ZnTe strained-layer superlattices (SLSs) grown by molecular-beam epitaxy (MBE) at a growth temperature of 320°C. In x-ray diffraction measurements, the satellite peak intensities relative to the zero-order peak intensity decreased with annealing time. The interdiffusion coefficient D was calculated assuming a linear diffusion model. The values of D=3.6×10- 21 to 2.2×10-19 cm2/s at an annealing temperature of 500°C were obtained for the ZnSe-ZnTe SLSs. In the high-resolution transmission electron microscopy (HRTEM) image of as-grown SLSs, the presence of fine superlattice structures was seen, but for interdiffused samples stripes due to the periodic superlattice structures were not visible and many dislocation lines were observed. These results suggest that the structure of SLSs is significantly modulated by thermal annealing at a temperature higher than the growth temperature.

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Interdiffusion in ZnSe-ZnTe strained-layer superlattices

Abstract

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