Interface magnetic anisotropy of Pd/Co2FexMn1-xSi/MgO layered structures

Takahide Kubota*, Tomonari Kamada, Jinhyeok Kim, Arata Tsukamoto, Shigeki Takahashi, Yoshiaki Sonobe, Koki Takanashi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)


Interface magnetic anisotropy of Co2FexMn1-xSi Heusler alloy thin films were studied quantitatively. Films of Co2MnSi (x = 1, CMS), Co2Fe0.5Mn0.5Si (x = 0.5, CFMS), and Co2FeSi (x = 1, CFS) were fabricated onto MgO (001) substrates with an epitaxially grown Pd (001) under layer, and were capped by an MgO layer. The maximum thickness for the perpendicular magnetization was 0.8 nm for CMS and CFMS, and it was 0.6 nm for CFS. The interface anisotropy energies (Ks) were 1.5, 1.5, and 1.2 erg/cm2 for CMS, CFMS, and CFS, respectively. The difference in Ks probably originated from the different alloying conditions at the bottom interface between Pd and Co2FexMn1-xSi layers.

Original languageEnglish
Pages (from-to)773-776
Number of pages4
JournalMaterials Transactions
Issue number6
Publication statusPublished - 2016
Externally publishedYes


  • Heusler alloy
  • Interface anisotropy
  • Perpendicular magnetization

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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