Interface microstructure of MgB2/Al-A1Ox/MgB 2 Josephson junctions studied by cross-sectional transmission electron microscopy

Kenji Ueda; Shiro Saito; Kouichi Semba; Toshiki Makimoto; Michio Naito

doi:10.1143/JJAP.46.L271

Interface microstructure of MgB₂/Al-A1O_x/MgB ₂ Josephson junctions studied by cross-sectional transmission electron microscopy

Kenji Ueda^*, Shiro Saito, Kouichi Semba, Toshiki Makimoto, Michio Naito

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We investigated the interface microstructure of sandwich-type MgB ₂/Al-AlO_x/MgB₂ Josephson tunnel junctions by cross-sectional transmission electron microscopy (TEM) in order to clarify the non-idealities in the junction characteristics. The results indicate that there are poor-crystalline MgB₂ layers and/or amorphous Mg-B composite layers of a few nanometers between the AlO_x barrier and upper MgB₂ layer. The poor-crystalline upper Mg-B layers seem to behave as normal metal or deteriorated superconducting layers, which may be the principal reason for all non-idealities of our MgB₂/Al-A1O_x-/ MgB₂ junctions.

Original language	English
Pages (from-to)	L271-L273
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	46
Issue number	12-16
DOIs	https://doi.org/10.1143/JJAP.46.L271
Publication status	Published - 2007 Apr 13
Externally published	Yes

Keywords

Film
Josephson junctions
MBE
MgB
TEM

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/JJAP.46.L271

Cite this

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title = "Interface microstructure of MgB2/Al-A1Ox/MgB 2 Josephson junctions studied by cross-sectional transmission electron microscopy",

abstract = "We investigated the interface microstructure of sandwich-type MgB 2/Al-AlOx/MgB2 Josephson tunnel junctions by cross-sectional transmission electron microscopy (TEM) in order to clarify the non-idealities in the junction characteristics. The results indicate that there are poor-crystalline MgB2 layers and/or amorphous Mg-B composite layers of a few nanometers between the AlOx barrier and upper MgB2 layer. The poor-crystalline upper Mg-B layers seem to behave as normal metal or deteriorated superconducting layers, which may be the principal reason for all non-idealities of our MgB2/Al-A1Ox-/ MgB2 junctions.",

keywords = "Film, Josephson junctions, MBE, MgB, TEM",

author = "Kenji Ueda and Shiro Saito and Kouichi Semba and Toshiki Makimoto and Michio Naito",

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T1 - Interface microstructure of MgB2/Al-A1Ox/MgB 2 Josephson junctions studied by cross-sectional transmission electron microscopy

AU - Ueda, Kenji

AU - Saito, Shiro

AU - Semba, Kouichi

AU - Makimoto, Toshiki

AU - Naito, Michio

PY - 2007/4/13

Y1 - 2007/4/13

N2 - We investigated the interface microstructure of sandwich-type MgB 2/Al-AlOx/MgB2 Josephson tunnel junctions by cross-sectional transmission electron microscopy (TEM) in order to clarify the non-idealities in the junction characteristics. The results indicate that there are poor-crystalline MgB2 layers and/or amorphous Mg-B composite layers of a few nanometers between the AlOx barrier and upper MgB2 layer. The poor-crystalline upper Mg-B layers seem to behave as normal metal or deteriorated superconducting layers, which may be the principal reason for all non-idealities of our MgB2/Al-A1Ox-/ MgB2 junctions.

AB - We investigated the interface microstructure of sandwich-type MgB 2/Al-AlOx/MgB2 Josephson tunnel junctions by cross-sectional transmission electron microscopy (TEM) in order to clarify the non-idealities in the junction characteristics. The results indicate that there are poor-crystalline MgB2 layers and/or amorphous Mg-B composite layers of a few nanometers between the AlOx barrier and upper MgB2 layer. The poor-crystalline upper Mg-B layers seem to behave as normal metal or deteriorated superconducting layers, which may be the principal reason for all non-idealities of our MgB2/Al-A1Ox-/ MgB2 junctions.

KW - Film

KW - Josephson junctions

KW - MBE

KW - MgB

KW - TEM

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