Interlayer exchange coupling in Co2FeAl0.5Si 0.5/Cr/Co2 FeAl0.5Si0.5 trilayers

T. Furubayashi*, K. Kodama, H. S. Goripati, Y. K. Takahashi, K. Inomata, K. Hono

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


Interlayer exchange couplings were examined for Co2 FeAl0.5 Si0.5 (CFAS) /Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90° coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.

Original languageEnglish
Article number07C305
JournalJournal of Applied Physics
Issue number7
Publication statusPublished - 2009
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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