Investigation of inxGa1-x As strain reducing layers effects on InAs/GaAs quantum dots

Shanmugam Saravanan*, Takashisa Harayama

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


Optical and morphological properties of self-assembled InAs quantum dots (QDs) covered by InxGa1-xAs strain reducing layers (SRL) with different thicknesses (2. 4, 6 and Snm) and compositions (x-0.13, 0.1.8 and 0.30) were investigated. Photolumincscencc from InAs QDs shows the dependence on indium mole fraction and thickness of the overgrown InxGa 1-xAs SRL. Improvement in PL intensity and narrowing of PL width up to 26 meV occurred together with a red shift of up to 138 nm when the QDs were coved with 6 nm of In0.18Ga0.82As. Also, we found that when the total amount of InAs deposited to form the QDs and the SRL was larger than a critical value of around 6MLs, the surface roughness increased and the PL intensity decreased drastically.

Original languageEnglish
Pages (from-to)53-59
Number of pages7
Journalieice electronics express
Issue number2
Publication statusPublished - 2008 Jan 25
Externally publishedYes


  • Atomic force microscopy
  • Molecular beam epitaxy
  • Photoluminescence
  • Quantum dots
  • Strain reducing layer

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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