Pb(Zrx, Ti1-x)03 (PZT)ceramics display the morphotropic phase boundary (MPB)around x=0.53. In general, PZT ceramics show the anomalously high piezoelectricity and dielectric constant near the MPB. However, PbTiO3 sputter-epitaxial films at x=0 showed higher kt2 than PZT near the MPB in our previous studies, with good reproducibility. In this study, in order to demonstrate that PZT sputter-epitaxial films do not display MPB (phase transition), we measured lattice constant, kt2, dielectric constant and coercive field as a function of x (Zr concentration). As a result, the phase transition was not observed in PZT sputter-epitaxial films. Such phenomena observed in sputter-epitaxial films may be attributed to the damage due to the negative oxygen ion bombardment on the films.