Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zr                         x                         , Ti                         1-x                         )03 Epitaxial Films

Ryuta Noda; Takahiro Shimidzu; Kiyotaka Wasa; Takahiko Yanagitani

doi:10.1109/ULTSYM.2018.8580154

Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zr _x , Ti _1-x )03 Epitaxial Films

Ryuta Noda, Takahiro Shimidzu, Kiyotaka Wasa, Takahiko Yanagitani

School of Advanced Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Pb(Zrx, Ti1-x)03 (PZT)ceramics display the morphotropic phase boundary (MPB)around x=0.53. In general, PZT ceramics show the anomalously high piezoelectricity and dielectric constant near the MPB. However, PbTiO3 sputter-epitaxial films at x=0 showed higher kt2 than PZT near the MPB in our previous studies, with good reproducibility. In this study, in order to demonstrate that PZT sputter-epitaxial films do not display MPB (phase transition), we measured lattice constant, kt2, dielectric constant and coercive field as a function of x (Zr concentration). As a result, the phase transition was not observed in PZT sputter-epitaxial films. Such phenomena observed in sputter-epitaxial films may be attributed to the damage due to the negative oxygen ion bombardment on the films.

Original language	English
Title of host publication	2018 IEEE International Ultrasonics Symposium, IUS 2018
Publisher	IEEE Computer Society
ISBN (Electronic)	9781538634257
DOIs	https://doi.org/10.1109/ULTSYM.2018.8580154
Publication status	Published - 2018 Dec 17
Event	2018 IEEE International Ultrasonics Symposium, IUS 2018 - Kobe, Japan Duration: 2018 Oct 22 → 2018 Oct 25

Publication series

Name	IEEE International Ultrasonics Symposium, IUS
Volume	2018-October
ISSN (Print)	1948-5719
ISSN (Electronic)	1948-5727

Other

Other	2018 IEEE International Ultrasonics Symposium, IUS 2018
Country/Territory	Japan
City	Kobe
Period	18/10/22 → 18/10/25

Keywords

Epitaxial film
MPB
PZT
Sputtering

ASJC Scopus subject areas

Acoustics and Ultrasonics

Access to Document

10.1109/ULTSYM.2018.8580154

Cite this

Noda, R., Shimidzu, T., Wasa, K., & Yanagitani, T. (2018). Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zr _x , Ti _1-x )03 Epitaxial Films In 2018 IEEE International Ultrasonics Symposium, IUS 2018 Article 8580154 (IEEE International Ultrasonics Symposium, IUS; Vol. 2018-October). IEEE Computer Society. https://doi.org/10.1109/ULTSYM.2018.8580154

Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zr _x , Ti _1-x )03 Epitaxial Films . / Noda, Ryuta; Shimidzu, Takahiro; Wasa, Kiyotaka et al.
2018 IEEE International Ultrasonics Symposium, IUS 2018. IEEE Computer Society, 2018. 8580154 (IEEE International Ultrasonics Symposium, IUS; Vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Noda, R, Shimidzu, T, Wasa, K & Yanagitani, T 2018, Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zr _x , Ti _1-x )03 Epitaxial Films in 2018 IEEE International Ultrasonics Symposium, IUS 2018., 8580154, IEEE International Ultrasonics Symposium, IUS, vol. 2018-October, IEEE Computer Society, 2018 IEEE International Ultrasonics Symposium, IUS 2018, Kobe, Japan, 18/10/22. https://doi.org/10.1109/ULTSYM.2018.8580154

Noda R, Shimidzu T, Wasa K, Yanagitani T. Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zr _x , Ti _1-x )03 Epitaxial Films In 2018 IEEE International Ultrasonics Symposium, IUS 2018. IEEE Computer Society. 2018. 8580154. (IEEE International Ultrasonics Symposium, IUS). doi: 10.1109/ULTSYM.2018.8580154

Noda, Ryuta ; Shimidzu, Takahiro ; Wasa, Kiyotaka et al. / Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zr _x , Ti _1-x )03 Epitaxial Films 2018 IEEE International Ultrasonics Symposium, IUS 2018. IEEE Computer Society, 2018. (IEEE International Ultrasonics Symposium, IUS).

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title = " Investigation of Morphotropic Phase Boundary in Sputter-Grown Pb(Zr x , Ti 1-x )03 Epitaxial Films ",

abstract = "Pb(Zrx, Ti1-x)03 (PZT)ceramics display the morphotropic phase boundary (MPB)around x=0.53. In general, PZT ceramics show the anomalously high piezoelectricity and dielectric constant near the MPB. However, PbTiO3 sputter-epitaxial films at x=0 showed higher kt2 than PZT near the MPB in our previous studies, with good reproducibility. In this study, in order to demonstrate that PZT sputter-epitaxial films do not display MPB (phase transition), we measured lattice constant, kt2, dielectric constant and coercive field as a function of x (Zr concentration). As a result, the phase transition was not observed in PZT sputter-epitaxial films. Such phenomena observed in sputter-epitaxial films may be attributed to the damage due to the negative oxygen ion bombardment on the films.",

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author = "Ryuta Noda and Takahiro Shimidzu and Kiyotaka Wasa and Takahiko Yanagitani",

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AB - Pb(Zrx, Ti1-x)03 (PZT)ceramics display the morphotropic phase boundary (MPB)around x=0.53. In general, PZT ceramics show the anomalously high piezoelectricity and dielectric constant near the MPB. However, PbTiO3 sputter-epitaxial films at x=0 showed higher kt2 than PZT near the MPB in our previous studies, with good reproducibility. In this study, in order to demonstrate that PZT sputter-epitaxial films do not display MPB (phase transition), we measured lattice constant, kt2, dielectric constant and coercive field as a function of x (Zr concentration). As a result, the phase transition was not observed in PZT sputter-epitaxial films. Such phenomena observed in sputter-epitaxial films may be attributed to the damage due to the negative oxygen ion bombardment on the films.

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