Ion-beam-induced epitaxial crystallization of amorphous GaAs on GaAs(100)

Naoto Kobayashi*, Hasegawa Masataka, Kobayashi Hisao, Hayashi Nobuyuki, Shinohara Makoto, Ohtani Fumihiko, Asari Masatoshi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Epitaxial crystallization of deposited amorphous GaAs layers on GaAs(100) up to the surface by bombardments with 400 keV Ar and 400 keV Kr has been successfully performed at a temperature range between 125 and 200°C. Properties of crystal growth were investigated as a function of ion species (Ar and Kr), energy (400 and 800 keV), ion dose, dose rate and substrate temperature by RBS channeling experiments. The growth rate has shown a nearly linear dependence on ion fluence. Ion bombardments below 100°C have induced further amorphization beyond the initial crystal/amorphous interface. On the scale of nuclear energy deposition density, bombardments with higher electronic excitation efficiency give a small increase of the growth rate. Ar bombardments have shown a strong dependence of the growth rate on dose rate, whereas Kr bombardments have revealed a weak dependence. An apparent activation energy of 0.13 ± 0.06 eV for the crystal growth was observed.

Original languageEnglish
Pages (from-to)449-453
Number of pages5
JournalNuclear Inst. and Methods in Physics Research, B
Volume59-60
Issue numberPART 1
DOIs
Publication statusPublished - 1991 Jul 1
Externally publishedYes

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Fingerprint

Dive into the research topics of 'Ion-beam-induced epitaxial crystallization of amorphous GaAs on GaAs(100)'. Together they form a unique fingerprint.

Cite this