Ionic/electronic mixed conductor tip of a scanning tunneling microscope as a metal atom source for nanostructuring

K. Terabe; T. Nakayama; T. Hasegawa; M. Aono

doi:10.1063/1.1480887

Ionic/electronic mixed conductor tip of a scanning tunneling microscope as a metal atom source for nanostructuring

K. Terabe, T. Nakayama, T. Hasegawa, M. Aono

Research output: Contribution to journal › Article › peer-review

47 Citations (Scopus)

Abstract

Silver sulfide (Ag₂S) which has Ag-ionic/electronic mixed conductivity is used for fabricating a tip used for a scanning tunneling microscope. The mixed conductor tip is capable of nanostructuring by depositing Ag atoms continuously on a sample as well as imaging the surface structure. To obtain the surface image, a nanoscale Ag protrusion is formed at an apex of the tip using a local solid electrochemical reaction, working as "a mini-tip." We fabricate a nanoscale line structure on the sample by scanning the Ag₂S tip with the protrusion under appropriate bias voltages and tunneling currents. The structuring is thought to be made up of two layers of Ag atoms deposited from the protrusion.

Original language	English
Pages (from-to)	4009-4011
Number of pages	3
Journal	Applied Physics Letters
Volume	80
Issue number	21
DOIs	https://doi.org/10.1063/1.1480887
Publication status	Published - 2002 May 27
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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AU - Terabe, K.

AU - Nakayama, T.

AU - Hasegawa, T.

AU - Aono, M.

PY - 2002/5/27

Y1 - 2002/5/27

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AB - Silver sulfide (Ag2S) which has Ag-ionic/electronic mixed conductivity is used for fabricating a tip used for a scanning tunneling microscope. The mixed conductor tip is capable of nanostructuring by depositing Ag atoms continuously on a sample as well as imaging the surface structure. To obtain the surface image, a nanoscale Ag protrusion is formed at an apex of the tip using a local solid electrochemical reaction, working as "a mini-tip." We fabricate a nanoscale line structure on the sample by scanning the Ag2S tip with the protrusion under appropriate bias voltages and tunneling currents. The structuring is thought to be made up of two layers of Ag atoms deposited from the protrusion.

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Ionic/electronic mixed conductor tip of a scanning tunneling microscope as a metal atom source for nanostructuring

Abstract

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