Longitudinal and transverse diffusion of electrons in high-pressure xenon

H. Kusano*, J. A M Lopes, M. Miyajima, Nobuyuki Hasebe

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)


    High-pressure xenon is an attractive medium for radiation detection in that the time projection chambers can be constructed by combined measurements of charge and light signals. The electron transport properties are essential information for developing and operating high-pressure xenon detectors. In this paper, our recent experimental results of electron diffusion coefficients in high-pressure xenon are presented. We measured the longitudinal diffusion coefficient of electrons under external applied electric fields in high-pressure xenon, ranging from 0.17 to 5.0 MPa in pressure at room temperature. A significant pressure dependence was found in the density-normalized longitudinal diffusion coefficient for low electric field region. We compared the longitudinal diffusion coefficient with the transverse one at a pressure of 1.0 MPa, and obtained the difference between both the diffusion coefficients. The longitudinal diffusion was found to become smaller than the transverse one when increasing the external electric field.

    Original languageEnglish
    Article numberC01028
    JournalJournal of Instrumentation
    Issue number1
    Publication statusPublished - 2013 Jan


    • Charge transport and multiplication in gas
    • Gamma detectors (scintillators, CZT, HPG, HgI etc)
    • Gaseous detectors
    • Time projection Chambers (TPC)

    ASJC Scopus subject areas

    • Instrumentation
    • Mathematical Physics


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