Low-temperature X-ray powder diffraction of Bi2Sr2CaCu2Ox superconductor

S. Kano; A. Yamazaki; R. Otsuka; M. Ohgaki; S. Nakamura; M. Akao; H. Aoki

doi:10.1080/01411599308207787

Low-temperature X-ray powder diffraction of Bi₂Sr₂CaCu₂O_x superconductor

S. Kano, A. Yamazaki, R. Otsuka, M. Ohgaki, S. Nakamura, M. Akao, H. Aoki

School of Creative Science and Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi₂Sr₂CaCu₂O_x superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi₂Sr₂CaCu₂Ox sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi₂Sr₂CaCu₂C_x were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.

Original language	English
Pages (from-to)	249-253
Number of pages	5
Journal	Phase Transitions
Volume	41
Issue number	1-4
DOIs	https://doi.org/10.1080/01411599308207787
Publication status	Published - 1993 Jan 1

Keywords

BiSrCaCuO
Low-temperature X-ray powder diffractometer
c-axial length
electrical resistivity

ASJC Scopus subject areas

Instrumentation
Materials Science(all)

Access to Document

10.1080/01411599308207787

Cite this

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title = "Low-temperature X-ray powder diffraction of Bi2Sr2CaCu2Ox superconductor",

abstract = "A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi2Sr2CaCu2Ox superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi2Sr2CaCu2Ox sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi2Sr2CaCu2Cx were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.",

keywords = "BiSrCaCuO, Low-temperature X-ray powder diffractometer, c-axial length, electrical resistivity",

author = "S. Kano and A. Yamazaki and R. Otsuka and M. Ohgaki and S. Nakamura and M. Akao and H. Aoki",

note = "Funding Information: This research was supported partly by the TAC Technology And Science superconductor-project from the TAC TAS Research Inc. The authors would like to thank Professor Shigeho Sueno at the Institute of Geoscience, University of Tsukuba, Professor Osamu Fukunaga and Associate Professor Hiroyuki lkawa in the Division of Crystalline Materials, Department of Inorganic Materials, Faculty of Engineering, Tokyo Institute of Technology, and Dr. lzumi Nakai at the University of Tsukuba, all of them members of the TAC TAS superconductor project, for their advice and discussions.",

year = "1993",

month = jan,

day = "1",

doi = "10.1080/01411599308207787",

language = "English",

volume = "41",

pages = "249--253",

journal = "Phase Transitions",

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AU - Kano, S.

AU - Yamazaki, A.

AU - Otsuka, R.

AU - Ohgaki, M.

AU - Nakamura, S.

AU - Akao, M.

AU - Aoki, H.

N1 - Funding Information: This research was supported partly by the TAC Technology And Science superconductor-project from the TAC TAS Research Inc. The authors would like to thank Professor Shigeho Sueno at the Institute of Geoscience, University of Tsukuba, Professor Osamu Fukunaga and Associate Professor Hiroyuki lkawa in the Division of Crystalline Materials, Department of Inorganic Materials, Faculty of Engineering, Tokyo Institute of Technology, and Dr. lzumi Nakai at the University of Tsukuba, all of them members of the TAC TAS superconductor project, for their advice and discussions.

PY - 1993/1/1

Y1 - 1993/1/1

N2 - A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi2Sr2CaCu2Ox superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi2Sr2CaCu2Ox sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi2Sr2CaCu2Cx were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.

AB - A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi2Sr2CaCu2Ox superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi2Sr2CaCu2Ox sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi2Sr2CaCu2Cx were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.

KW - BiSrCaCuO

KW - Low-temperature X-ray powder diffractometer

KW - c-axial length

KW - electrical resistivity

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