TY - GEN
T1 - Maskless fabrication for micropad interconnection using electroless NiB deposition and application to "chemical" flip-chip bonding
AU - Yokoshima, T.
AU - Yamaji, Y.
AU - Igawa, N.
AU - Kikuchi, K.
AU - Nakagawa, H.
AU - Aoyagi, M.
PY - 2009/11/23
Y1 - 2009/11/23
N2 - Deposition behavior of localized electroless NiB deposition for pad-to-pad connection was investigated. Localized deposition occurred mainly on the area between facing pads, and anisotropic deposition toward each facing pad was obtained. Thus, this connection, "preferential bridge connection", is no need of photolithographic technique. These results indicated that this process is one of the maskless fabrication processes. Moreover, chemical flip-chip bonding containing preferential bridge interconnection was demonstrated. The chip-to-substrate interconnection with 30 μm pitch was successfully achieved.
AB - Deposition behavior of localized electroless NiB deposition for pad-to-pad connection was investigated. Localized deposition occurred mainly on the area between facing pads, and anisotropic deposition toward each facing pad was obtained. Thus, this connection, "preferential bridge connection", is no need of photolithographic technique. These results indicated that this process is one of the maskless fabrication processes. Moreover, chemical flip-chip bonding containing preferential bridge interconnection was demonstrated. The chip-to-substrate interconnection with 30 μm pitch was successfully achieved.
UR - http://www.scopus.com/inward/record.url?scp=70349654469&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=70349654469&partnerID=8YFLogxK
U2 - 10.1149/1.3115653
DO - 10.1149/1.3115653
M3 - Conference contribution
AN - SCOPUS:70349654469
SN - 9781615672967
T3 - ECS Transactions
SP - 77
EP - 85
BT - ECS Transactions - Electronics Packaging 3 - 214th ECS Meeting
T2 - Electronics Packaging 3 - 214th ECS Meeting
Y2 - 12 October 2008 through 17 October 2008
ER -