Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure

Kiyoshi Takeuchi; Tomoko Mizutani; Takuya Saraya; Masaharu Kobayashi; Toshiro Hiramoto; Hirofumi Shinohara

doi:10.1109/ICMTS.2016.7476191

Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure

Kiyoshi Takeuchi, Tomoko Mizutani, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto, Hirofumi Shinohara

Graduate School of Information, Production and Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Citations (Scopus)

Abstract

SRAM data just after power-up were measured using an addressable SRAM cell array test structure. It was found that the results are strongly affected by the address switching noise and memory effect. An addressing sequence combined with word line reset pulse application is proposed for reliable power-up data stability evaluation.

Original language	English
Title of host publication	2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	130-134
Number of pages	5
ISBN (Electronic)	9781467387934
DOIs	https://doi.org/10.1109/ICMTS.2016.7476191
Publication status	Published - 2016 May 20
Event	29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Yokohama, Japan Duration: 2016 Mar 28 → 2016 Mar 31

Publication series

Name	IEEE International Conference on Microelectronic Test Structures
Volume	2016-May

Other

Other	29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016
Country/Territory	Japan
City	Yokohama
Period	16/3/28 → 16/3/31

Keywords

SRAM
physical unclonable function
test structure

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/ICMTS.2016.7476191

Cite this

Takeuchi, K., Mizutani, T., Saraya, T., Kobayashi, M., Hiramoto, T., & Shinohara, H. (2016). Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure. In 2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings (pp. 130-134). [7476191] (IEEE International Conference on Microelectronic Test Structures; Vol. 2016-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICMTS.2016.7476191

Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure. / Takeuchi, Kiyoshi; Mizutani, Tomoko; Saraya, Takuya et al.
2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. p. 130-134 7476191 (IEEE International Conference on Microelectronic Test Structures; Vol. 2016-May).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Takeuchi, K, Mizutani, T, Saraya, T, Kobayashi, M, Hiramoto, T & Shinohara, H 2016, Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure. in 2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings., 7476191, IEEE International Conference on Microelectronic Test Structures, vol. 2016-May, Institute of Electrical and Electronics Engineers Inc., pp. 130-134, 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016, Yokohama, Japan, 16/3/28. https://doi.org/10.1109/ICMTS.2016.7476191

Takeuchi K, Mizutani T, Saraya T, Kobayashi M, Hiramoto T, Shinohara H. Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure. In 2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc. 2016. p. 130-134. 7476191. (IEEE International Conference on Microelectronic Test Structures). doi: 10.1109/ICMTS.2016.7476191

Takeuchi, Kiyoshi ; Mizutani, Tomoko ; Saraya, Takuya et al. / Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure. 2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 130-134 (IEEE International Conference on Microelectronic Test Structures).

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Measurement of SRAM power-up state for PUF applications using an addressable SRAM cell array test structure

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