Abstract
This letter reports a charge collection experiment of alpha-particle-induced carriers in the cell arrays of the 1 Mb DRAM. It is indicated that this experiment is effective to estimate the soft error rate of VLSI memories with various kinds of structures.
Original language | English |
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Title of host publication | Transactions of the Institute of Electronics, Information and Communication Engineers, Section E ( |
Pages | 1060-1061 |
Number of pages | 2 |
Volume | E70 |
Edition | 11 |
Publication status | Published - 1987 Nov |
Externally published | Yes |
Event | Pap from the 1987 Natl Conf on Semicond Devices and Mater IEICE - Kumamoto, Jpn Duration: 1987 Nov 1 → 1987 Nov 4 |
Other
Other | Pap from the 1987 Natl Conf on Semicond Devices and Mater IEICE |
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City | Kumamoto, Jpn |
Period | 87/11/1 → 87/11/4 |
ASJC Scopus subject areas
- Engineering(all)