Micro-Raman spectroscopy on pentacene thin-film transistors

Yoshinobu Hosoi*, Daniel Martinez Deyra, Kazuhiro Nakajima, Yukio Furukawa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

Molecular orientation in pentacene films and thin-film transistors has been studied by micro-Raman spectroscopy. We have found that the relative intensity of the 1596-cm-1 band (B3g) is sensitive to the molecular orientation. The standing orientation was observed for the films formed on the bare and hexamethyldisilazane (HMDS)-modified SiO2 surfaces and the Au surfaces modified with self-assembled monolayers (SAMs), whereas the lying orientation for the films on the bare Au surface. We have explicitly demonstrated the differences of the molecular orientation in the films on SiO2 dielectric layers and Au electrodes in the devices by mapping measurements.

Original languageEnglish
Pages (from-to)317-323
Number of pages7
JournalMolecular Crystals and Liquid Crystals
Volume491
DOIs
Publication statusPublished - 2008

Keywords

  • Organic thin-film transistor
  • Pentacene
  • Raman spectroscopy

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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